Field Emission Scanning Electron Microscopes
Tue, 11/26/2013 - 11:11am
Carl Zeiss Microscopy LLC has introduced its new Crossbeam series. The newly developed focused ion beam (FIB) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real time. High resolution over the entire voltage and current range allows users to work quickly and precisely. Designed of stability, the system ensures reproducible results, even in long-term experiments. The field of application is expanded by the optionally available massive ablation laser that rapidly prepares samples to access deeply buried regions of interest. Crossbeam is suitable for use in both materials and life sciences. The microscope system is available in two versions. The GEM-INI I VP (variable pressure) column of Crossbeam 340 offers optimal analysis conditions for in situ experiments with outgassing and charging specimens. Thanks to the GEMINI II column with double condenser system, Crossbeam 540 users benefit from more information in a shorter time. The system delivers high resolution, even with low voltage and high beam current, enabling fast analytics and ease of use.
Carl Zeiss Microscopy LLC, www.zeiss.com