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Contact Resonance Viscoelastic Mapping Mode

Mon, 10/21/2013 - 9:21am

Contact Resonance Viscoelastic Mapping ModeAsylum Research has introduced the Contact Resonance Viscoelastic Mapping Mode, an option available for Asylum’s Cypher and MFP-3D atomic force microscopes (AFMs). Contact resonance (CR) enables high resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus. The technique is particularly well suited for characterizing moderate to high modulus materials in the range of about 1 GPa to 200 GPa for materials such as composites, thin films, biomaterials, polymer blends and even ceramics and metals.

Asylum Research also offers technologies that enable the high performance of Contact Resonance Viscoelastic Mapping Mode. Highly damped cantilever and sample actuators were developed for both the MFP-3D and Cypher AFMs to provide clean, wideband excitation that makes operation more robust and accurate. Dual AC Resonance Tracking (DART) and band excitation electronics make it possible to rapidly measure both the contact resonance frequency and quality factor, providing measures of both the elastic and viscous responses at higher speeds. The modes software enables users to select the most appropriate analysis models and easily guides them through the steps required to calibrate the technique.

Asylum Research, www.asylumresearch.com

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