Bruker Corp.'s Innova-IRIS is an integrated system for correlated atomic force microscopy (AFM) and Raman spectroscopic imaging. Ultra-low closed-loop noise, no-drift mechanical stability, and wide-open optical access make the Innova AFM suitable for Tip-Enhanced Raman Spectroscopy (TERS) research.
The Innova-IRIS model leverages the AFM head design of the Innova platform to provide TERS-ready AFM-Raman integration suitable for the sensitive interrogation of opaque samples. Compatible with Raman systems, the AFM implements the optimized off-axis Raman geometry necessary for maximum sensitivity. With multiple simultaneous optical views, simplified approach curves for TERS signal evaluation, and automated mapping, the integration accelerates setup and data acquisition and preserves the performance and capabilities of each instrument in separate operation and provides featured analysis packages for the AFM and Raman data.
Bruker Corp., www.bruker.com