Hiden Analytical's UHV ion guns for SIMS/SNMS applications—the IG5C and the IG20—now feature the Windows PC-based LabView program and control interface, which together provide fully integrated control of all ion source, beam steering, and internally generated raster scan parameters. They also enable store and recall of multiple profiling, imaging, and sputter-cleaning formats. The on-screen virtual interface panel gives access to all of the relevant parameters, with adjustment by the simulated rotary dial.
The IG20 ion gun addresses analysis of electro-positive species and is an electron impact gas source system for operation with both oxygen and inert gases, with a beam diameter of just 50 micron. The IG5C system with a caesium surface ionization source is for measurement of electronegative species and features a low power thermal-contact ion source with a beam diameter down to only 20 micron. Both guns operate with ion beam energies to 5 KV and are configured with integral differential pumping to maintain true UHV integrity throughout the analyses.
Hiden Analytical, www.hidenanalytical.com