Corporation, a supplier of oscilloscopes, protocol analyzers and serial
data test solutions, today announced the launch of a new class of
instrument, the SPARQ series of Signal Integrity Network Analyzers. The
SPARQ measures 40 GHz S-parameters on up to 4-ports with single button
press operation at a small fraction of the cost of traditional methods
such as Vector Network Analyzers. With the low price and ease of use of
the SPARQ, multi-port S-parameter measurements are now accessible to a
much wider audience.
The SPARQ is a time domain instrument, using TDR/T technology along with patented LeCroy innovations to rapidly acquire waveforms and measure the S-parameters of a device under test. The SPARQ measures both frequency and time domain results, and outputs standard Touchstone S-parameter files that are ready to be loaded into the user’s simulation software. The unit is small, rugged, PC-based and portable, and includes all of the hardware and software tools required by the signal integrity engineer for characterizing passive devices.
The SPARQ calibrates using an OSLT calibration kit that is internal to the unit. This allows the calibration and measurement to proceed automatically with a single button click and without any need to connect and disconnect calibration standards. With the SPARQ, the painstaking, lengthy and error-prone calibration procedure is once and for all eliminated. The “E” model SPARQ units include the internal calibration capability standard, and also support manual calibration using an external calibration kit. Setting up the SPARQ is also fast and easy; all configurations for the S-parameter measurements are contained within a single setup screen.
When using the automatic calibration, the SPARQ de-embeds the attached cables, adapters and fixture to return the S-parameters of just the device under test. Users have no need to worry about the location of the reference plane or to employ separate software to assist in the measurement process. A standard SPARQ includes all of the hardware and software tools required for fast and accurate S-parameter measurements with high dynamic range. Users can measure single-ended, differential and mixed-mode S-parameters (both magnitude and phase), and view corresponding time domain results including step response, impulse response, rho and Z normalized to a user-selectable rise time. These features are available at no extra cost to the user. The TDR and TDT waveforms can also be viewed, and the unit includes a very lively TDR/TDT mode of operation for debugging purposes.
The software provided with the SPARQ will be familiar to users of LeCroy’s Windows-based oscilloscopes, sharing the same overall look and feel and user-friendly operation. Up to 16 S-parameters result waveforms can be displayed simultaneously, with the ability to zoom, reposition and perform math and measurements on waveforms in a manner similar to leading LeCroy oscilloscopes.
Three models are available: the SPARQ-4004E (40GHz, 4-port, internal calibration), SPARQ-4002E (40GHz, 2-port, internal calibration) and SPARQ-4002M (40GHz, 2-port, manual calibration).