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Krios is optimized for cryo-analysis and more

Mon, 05/19/2008 - 2:15pm

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FEI’s transmission electron microscope, the Krios, is suited for automated single particle analysis, 2-D electron crystallography, and dual-axis tomography. Acceleration voltage varies from 80 to 300 kV and automated contamination-free loading handles 12 samples at a time.

FEI, www.fei.com

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