EDAX Inc. has introduced the Octane Series silicon drift detectors (SDD) for its TEAM EDS analysis system on electron microscopes.
By incorporating advancements in SDD technology, the Octane SDD family delivers high-quality EDS data at previously unachievable speeds. The Octane Series includes four models—the Pro, Plus, Super, and Ultra—that are designed specifically to meet the demands of key microanalysis applications. At the core of the SSDs is an advanced spectrometer design and electronics that enable energy resolution down to 121 eV with efficiency in converting input counts into stored data.
Pairing the SDD technology with EDAX's TEAM EDS software allows users to take advantage of the Smart Features in TEAM systems to optimize their analysis time and get the best data possible from their sample. In addition to Smart Quant and EXpert ID, the Smart Pulse Pile-Up Correction feature minimizes concerns typical of high count rate collections and allows maximum use of SDD technology.
EDAX Inc., a unit of Ametek Materials Analysis Division, www.edax.com