McBain Systems has introduced a system—the BT-IR benchtop infrared microscope system—for interior, infrared (IR) inspection for semiconductor and other advanced technology industries. The system allows an operator to see through materials that are transparent in the infrared range between 740 and 1,700 nm.
The BT-IR yields submicron-precision optical measurements, and its staging provides up to 0.1 micron linear encoder resolution. The system is reputed to have the highest resolution 900 to 1,700 InGaAs digital camera in its class, according to the company.
The BT-IR system features a motorized XY stage with joystick controls to navigate, observe, and measure bonded wafer/die alignments, find defects in a manual mode, and determine material stress through the system’s option birefringence capability.
McBain Systems, www.mcbainsystems.com