TESTING SYSTEMS
Analysis Software for USB Protocol Analyzers
May 22, 2013 10:27 am | Product Releases | CommentsAgilent Technologies Inc. has introduced a new analysis software suite for the U4611A, U4611B, and U4612A family of USB protocol analyzers. The suite features MegaZoom technology, offering USB device designers insight into their designs’ behavior, and streamlining USB test and validation.
LISTED UNDER: Testing Systems & Equipment
Transparent Thin-Film Metrology System
May 13, 2013 8:35 am | Product Releases | CommentsRudolph Technologies Inc. has introduced the S3000SX thin-film metrology system for transparent films in advanced semiconductor fabrication applications at the 28-nm node and below. This latest addition to the S3000 product family uses Rudolph’s focused beam ellipsometry (FBE) and small site measurement optics (SSMO) to measure the thickness of single-layer and multilayer films on product wafers.
LISTED UNDER: Metrology
Modular DC Electronic Load for Multichannel DC Source Testing
May 6, 2013 9:35 am | Product Releases | CommentsB&K Precision has introduced the MDL Series, a modular programmable DC electronic load system. The MDL Series comprises six modules ranging in power from 200 W to 600 W. Any combination of these modules can be installed for multichannel operation in the 4-slot MDL Series mainframe, which supports up to 2400 W and up to 4800 W with a mainframe extension connected.
LISTED UNDER: Testing Systems & Equipment
Compact Tabletop Testers
March 20, 2013 2:46 pm | Product Releases | CommentsThe need for physical property testing has increased in wide range of applications. To address this demand, Shimadzu Scientific Instruments Inc. has launched the EZ Test EZ-X Series of compact tabletop testers. The EZ-X Series consists of three different testers, which can be configured into 29 different models designed to meet the small-capacity testing requirements of many industries.
LISTED UNDER: Material Testing, General | Physical Testing, General
Digital Storage Oscilloscope
March 14, 2013 8:03 am | Product Releases | CommentsB&K Precision has expanded its digital storage oscilloscope (DSO) portfolio with the release of their 2550 Series, which adds four two-channel models and four four-channel models ranging from 70 MHz to 200 MHz bandwidth with 2 GSa/s sampling rates and 224 kpts/Ch memory.
LISTED UNDER: Oscilloscopes
Ultrasonic Sensors for Gas Flow Measurement
February 15, 2013 12:49 pm | Product Releases | CommentsMorgan Technical Ceramics (MTC) has announced its new line of ultrasonic sensors for gas flow measurement, ideal for integrating into acoustic anemometry systems and SMART metering systems for measuring natural gas usage, as well as air-coupled level measurement of liquids and solids. The transducer transmits and receives ultrasonic waves across a gas channel for time of flight measurement.
LISTED UNDER: Testing Systems & Equipment
High-Definition Oscilloscope
January 11, 2013 9:01 am | Agilent Technologies Inc. | Product Releases | CommentsAgilent Technologies Inc. has introduced Infiniuum 9000 H-Series high-definition oscilloscopes. The four models come in bandwidths of 250 MHz, 500 MHz, 1 GHz, and 2 GHZ, and offer up to 12-bit vertical resolution. The oscilloscopes also include deep standard memory of up to 100 Mpts per channel.
LISTED UNDER: Oscilloscopes
Miniature Triaxial Accelerometers
October 30, 2012 3:04 pm | Product Releases | CommentsMeggitt Sensing Systems has announced that the Endevco 35A miniature triaxial ISOTRON piezoelectric accelerometer is now supporting the high-precision shock and vibration testing of hard drives, electronic peripherals, engine rotor and stator blades, as well as their associated components.
LISTED UNDER: Mechanical Devices | Machine Vibration Testing/Analysis | Testing, Accessories
Tablet Coating Adhesion Fixture
October 26, 2012 2:50 pm | Brookfield Engineering Laboratories, Inc. | Product Releases | CommentsBrookfield Engineering Laboratories offers the TA-TCA Tablet Coating Adhesion Fixture for their CT3 tester. The fixture is designed to measure how well the coating adheres to the surface of a tablet.
LISTED UNDER: Physical Testing, General
Seven New Configurations for Parametric Curve Tracer
October 23, 2012 12:08 pm | Product Releases | CommentsKeithley Instruments has combined a curve tracer’s range and simplicity with a parametric analyzer’s flexibility and precision. Using its existing line of source measure units, curve tracers, software, and test fixtures, Keithley offers parametric curve tracing applications for high power devices up to 3,000 V and 100 A.
LISTED UNDER: Oscilloscopes | Testers, Semiconductor Device Thermal Resistance | Testing Systems & Equipment
High-Definition Oscilloscope
October 22, 2012 8:46 am | Product Releases | CommentsTeledyne LeCroy has introduced two series of high-definition oscilloscopes with HD4096 high-definition technology—the HDO4000 and HDO6000. Oscilloscopes with HD4096 acquire waveforms with high resolution, high sample rate, and low noise.
LISTED UNDER: OscilloscopesParticle Characterization System
October 3, 2012 8:02 am | Product Releases | CommentsFollowing the completion of a highly successful early access program, Malvern Instruments has now launched the Morphologi G3-ID particle characterization system. This fully automated system measures particle size, shape and chemical identity in a single platform.
LISTED UNDER: Particle CharacterizationHigh Sensitivity Protein Characterizer
September 28, 2012 9:36 am | Product Releases | CommentsThe new Zetasizer Nano ZSP from Malvern Instruments is a high specification dynamic light scattering system that delivers top-of-range protein characterization capabilities, including zeta potential measurements.
LISTED UNDER: Particle CharacterizationScanning Probe Head
September 24, 2012 5:40 am | Product Releases | CommentsHexagon Metrology has introduced the LSP-X1h probe head for analog scanning on select Global Silver Coordinate Measuring Machines (CMMs). The high-accuracy 3D analog scanning probe rapidly collects thousands of data points for precise evaluation of complex part features.
LISTED UNDER: Metrology
High-Precision Hydraulic Universal Testers
July 24, 2012 4:56 am | Product Releases | CommentsShimadzu Scientific Instruments Inc. has introduced the UH-X/FX Series of hydraulic universal testing machines designed for high-precision testing control. The testers feature an environmentally friendly design, allowing for energy reduction expenditures in testing laboratories.
LISTED UNDER: Physical/Materials Testing
