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Surface Area

SIMS Surface Analyzers

November 24, 2014 10:42 am | Product Releases | Comments

Secondary ion mass spectrometry (SIMS) is a versatile, highly selective technique for compositional analysis of surfaces from the atomic level through to depths of 100s of nanometers. Hiden Analytical has extended their series of SIMS systems to offer the choice of equipment specification levels to suit a broad spread of budget capacities while maintain the potential to subsequently expand to the top-level specification.

LISTED UNDER: ANALYSIS INSTRUMENTS | Surface Analyzers | Surface Area

High-resolution Surface Characterization

February 4, 2014 1:56 pm | Product Releases | Comments

Micromeritics 3Flex surface characterization analyzer is an automated, three-station instrument capable of high-performance physisorption, mesopore, micropore and chemisorption analyses with high accuracy, resolution and data reduction. Each analysis station is upgradeable from mesopore to micropore with the option of designating one station for chemisorption analyses.

LISTED UNDER: Surface Area | Automation Equipment

Surface Characterization Analyzer

February 26, 2013 3:48 pm | Product Releases | Comments

Micromeritics' 3Flex surface characterization analyzer is an automated, three-station instrument capable of high-throughput surface area mesopore and micropore analyses. Servo control for dosing and evacuation provides a high degree of gas management and speeds the collection of data points through reduction of dosing overshoot.

LISTED UNDER: Surface Area
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Surface Characterization Analyzer

October 26, 2012 1:05 pm | Product Releases | Comments

Micromeritics’ 3Flex surface characterization analyzer is an automated, three-station instrument capable of high-throughput surface area, mesopore, and micropore analyses with high accuracy, resolution, and data reduction.

LISTED UNDER: Surface Area

Multipurpose Device for Laboratory, Production

June 6, 2012 5:16 am | Product Releases | Comments

Fries Research & Technology has enhanced its MicroSpy Topo DT. The surface measuring device combines two measuring technologies—a confocal microscope and a white light interferometer—in a compact design.

LISTED UNDER: Surface Area | Other Microscope Supplies | Microscopes, Optics, Image Analysis, Lasers, Cameras
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