Spectrometry/Spectroscopy
Spectroscopy Software
May 15, 2013 9:26 am | Product Releases | CommentsOcean Optics has introduced OceanView spectroscopy software, combining data processing capabilities with a clear graphical user interface (GUI) for use with the company’s miniature spectrometers. The software is customizable and includes a schematic view that provides a visual roadmap of data flow from spectral inputs to processed results.
LISTED UNDER: Software | Spectrometry/Spectroscopy
AFM/Raman Spectroscopy System
May 15, 2013 9:23 am | Agilent Technologies Inc. | Product Releases | CommentsAgilent Technologies Inc. has introduced a high-performance AFM/Raman system for life science and materials science applications. The systems integrates the Agilent 600ILM AFM (atomic force microscope) and a Horiba XploRA INV (inverted Raman microscope).
LISTED UNDER: Atomic Force | Raman | Microscopes, Optics, Image Analysis, Lasers, Cameras
Cryogen-Free Benchtop NMR
May 3, 2013 8:32 am | Product Releases | CommentsOxford Instruments has introduced Pulsar, a benchtop cryogen-free nuclear magnetic resonance (NMR) analyzer. The instrument’s small footprint is suitable for most laboratories and industrial production areas.
LISTED UNDER: NMR | Spectrometry/Spectroscopy
Molecular Beam Mass Spectrometer
May 2, 2013 9:26 am | Hiden Analytical Inc. | Product Releases | CommentsHiden Analytical’s Hiden HPR-60 mass spectrometer is a research tool for direct analysis of ions, radicals, and neutral species in reactive processes. The system operates in pressure regimes from 5 mbar to 5 bar, and mass spectrometer options provide for measurement of neutrals, positive ions, negative ions, and ion energies with choice of mass range up to 2,500 amu.
LISTED UNDER: Other Mass | Spectrometry/Spectroscopy
Caesium Ion Gun for SIMS
April 19, 2013 8:26 am | Hiden Analytical Inc. | Product Releases | CommentsThe Hiden Analytical IG5C high-brightness caesium ion gun produces an intense beam of caesium ions suited to SIMS depth profiling, surface physics, and surface modification for analysis of electronegative elements and MCs+ clusters, where M is the element of interest.
LISTED UNDER: Spectrometry/Spectroscopy
Handheld Raman Spectrometer
April 17, 2013 8:25 am | B&W Tek, Inc. | Product Releases | CommentsB&W Tek Inc. has announced enhancements to its NanoRam handheld Raman spectrometer. The enhanced NanoRam spectrometer features an embedded 2D barcode scanner, batch scanning capabilities, IP-64-rated (dust tight and splash proof) housing, Ethernet connectivity, and other software enhancements based on user feedback to better facilitate tracking and reporting.
LISTED UNDER: Raman | Spectrometers | Spectrometry/Spectroscopy
NMR Superconducting Magnet
April 17, 2013 8:22 am | Product Releases | CommentsJEOL Resonance has developed a nuclear magnetic resonance superconducting magnet that operates on a minimum amount of liquid helium. The JEOL Resonance Zero Boil Off magnet reduces consumption of liquid helium by reliquifying the helium gas generated by evaporation of the helium in the magnet.
LISTED UNDER: NMR | Nuclear Magnetic Resonance | Spectrometry/Spectroscopy
Miniature Photodiode Array Spectrometer
April 16, 2013 9:19 am | Product Releases | CommentsHoriba Scientific has introduced the VS-7000-PDA Mini PDA spectrometer. The miniature fiber-optic linear photodiode array spectrometer features popular UV-VIS ranges in a miniature grating spectrometer, including UV-VIS (200 to 860 nm), VIS (380 to 750 nm), or UV-NIR (200 to 1,050 nm).
LISTED UNDER: Fiber Optic | Spectrometers | Spectrometry/Spectroscopy
Microspectrophotometer
April 4, 2013 8:36 am | Product Releases | CommentsCraic Technologies has introduced the 20/30 PV microspectrophotometer which is designed to non-destructively analyze microscopic samples from the deep ultraviolet to the near infrared by several techniques.
LISTED UNDER: Spectrometry/Spectroscopy
Pulsed Plasma Characterization
April 1, 2013 9:22 am | Hiden Analytical Inc. | Product Releases | CommentsThe performance of the Hiden Analytical family of plasma diagnostic tools is further advanced by integration of onboard timers for real-time pulsed plasma measurement, the fast gating controllable within the MASsoft operating program.
LISTED UNDER: Gratings | Mass Spectrometers/Accessories | Spectrometry/Spectroscopy
DART Ion Mobility Spectrometer
March 21, 2013 10:47 am | Product Releases | CommentsPhotonis USA has introduced the DART Ion Mobility Spectrometer, designed for simplified, fast analysis of solids or liquids to detect contaminants or qualify material.
LISTED UNDER: Ion Mobility | Spectrometry/Spectroscopy
Compact NMR Spectrometer
March 21, 2013 10:36 am | Product Releases | CommentsMagritek introduced the Spinsolve compact NMR spectrometer at Pittcon 2013. The benchtop instrument brings fast, high-resolution NMR spectroscopy to the chemistry bench and the chemistry classroom.
LISTED UNDER: NMR | Spectrometry/Spectroscopy
Ambient Ionization System for GC/MS Instrument
March 21, 2013 10:25 am | Product Releases | CommentsIonSense Inc. has introduced the DART GSX system for the Agilent GC/MSD, enabling ambient ionization on a GC/MS instrument. Users of Agilent's GC/MS instruments now are able to add direct analysis in real time (DART) capability to their laboratories and experience the benefits of rapid analysis with little sample preparation and simplified spectral analysis.
LISTED UNDER: Spectrometry/Spectroscopy
Diamond ATR Analyzers
March 21, 2013 10:05 am | Product Releases | CommentsDurasens introduced its LSP-T Series of diamond ATR analyzers at Pittcon 2013. The compact, easy-to-use diamond ATR analyzers are designed for the rapid analysis of liquids, oils, emulsions, gels, pastes, and slurries under controlled temperatures by mid-IR FT-IR spectroscopy.
LISTED UNDER: FT-IR | Spectrometry/Spectroscopy
FT-NIR Analyzer
March 21, 2013 9:42 am | Product Releases | CommentsABB has introduced the TALYS ASP500 Series, a fiber optics-based industrial FT-NIR analyzer. The analyzer is used for reactor profiling, real-time determination of process end-point, cycle-time reduction, process characterization, and early troubleshooting.
LISTED UNDER: FT-IR | Spectrometry/Spectroscopy
