Quadrupole Mass Spectrometer

May 22, 2015 8:26 am | by Hiden Analytical Inc. | Hiden Analytical, Inc. | Product Releases | Comments

The efficiency of synchrotron light sources is heavily dependent on the vacuum quality within the beam lines, small mass spectrometers (RGAs) are routinely utilized to provide real-time vacuum monitoring for confirmation of contaminant status, and the associated radiation level is a potential issue. Hiden Analytical manufactures quadrupole mass spectrometers with radiation hardened electronics having operation established at radiation levels in the regime of 1x10E7 Rads per annum.

LISTED UNDER: Spectrometers | Mass, Quadrupole | Spectrometers

CCD-UV Absorbance Spectrophotometer

April 7, 2015 3:41 pm | by McPherson | McPherson | Product Releases | Comments

McPherson's VUVAS spectrophotometer capitalizes on the speed and sensitivity of direct detection, ultraviolet sensitive CCD detectors. Faster data acquisition enables more complex data sets involving spectral response vs. temperature or time. Fast acquisition also protects against potential measurement errors due to changing sample or environmental conditions.

LISTED UNDER: Spectrophotometers


April 3, 2015 6:47 pm | by CRAIC Technologies | CRAIC Technologies | Product Releases | Comments

Craic Technologies' 20/30 XL is designed to work with large-scale samples, such as 300-mm wafers, to measure thin film thickness as well as the Raman spectra of microscopic sampling areas. The 20/30 XL also offers UV microscopy, a full spectroscopy suite as well as either manual or automated operation.

LISTED UNDER: Raman | Raman | Spectrophotometers

Circular Polarization Spectroscopy of Microscopic Samples

March 16, 2015 8:34 pm | by CRAIC Technologies | CRAIC Technologies | Product Releases | Comments

CRAIC Technologies has introduced the addition of circular polarization spectroscopy capabilities to CRAIC microspectrophotometers. This unique feature is offered as packages that allow users to measure the circular polarization spectra in either transmission or reflectance modes. The ability to measure circular polarization microspectra represents a powerful new tool for both materials science and biological research.

LISTED UNDER: Spectrometry/Spectroscopy | Spectrophotometers | UV-VIS-NIR

Mass Spectrometer with Powerful Data Analysis Software

March 11, 2015 12:34 pm | by JEOL USA, Inc. | JEOL USA, Inc. | Product Releases | Comments

JEOL has introduced the AccuTOF-GCx, the fourth generation of JEOL’s successful gas chromatography/time-of-flight mass spectrometer systems. The AccuTOF-GCx is designed for optimum throughput, operation and uptime. It offers improved resolution, accuracy and sensitivity, while retaining the power and flexibility of the previous models.


NIR Analysis Technology

February 20, 2015 11:03 am | by KROHNE Inc. | Product Releases | Comments

KROHNE Inc. announces its new SpectroBAY process near-infrared (NIR) spectrometer system for efficient process control in the chemical industry. Improving chemical plant reliability and profitability through automated control, the SpectroBAY system is suitable for a range of applications, including fluids, gases and suspensions in conjunction with optical sensors.


Deep Ultraviolet Luminescence Spectrophotometer

January 27, 2015 3:08 pm | by McPherson | McPherson | Product Releases | Comments

McPherson’s Deep UV Luminescence Spectrophotometer extends capabilities for material science and novel, efficient lighting research. McPherson has announce improved optical characterization systems for spectral measurements from the vacuum ultraviolet (VUV) to the near infrared. The vacuum ultraviolet universal spectrophotometer is an optical test system optimized for emitting samples like phosphors or photo- and electro-luminescent crystals.

LISTED UNDER: Analytical Instrumentation | SPECTROMETRY AND SPECTROSCOPY | Spectrometers


January 27, 2015 9:49 am | by Ionicon Analytik GmbH | Product Releases | Comments

IONICON PTR-TOF systems are capable of measuring trace gas samples in real-time with a high mass resolving power. The new “fastGC” module adds an optional chemical separation step before the analysis. The module consists of a short GC column with an advanced heating concept for ultra-fast heating and equally fast cooling rates which makes this pre-separation step nearly real time.


Surface Enhanced Raman Spectroscopy Substrate

December 30, 2014 9:37 am | Product Releases | Comments

Ocean Optics has introduced a new substrate for surface enhanced Raman spectroscopy (SERS) applications. Using precisely controlled gold nanoparticles, Ocean Optics SERS substrates amplify very weak Raman signals by many orders of magnitude. The result is fast, repeatable SERS measurements for the identification and quantification of SERS-active analytes.

LISTED UNDER: Glass Substrates | Raman

NIR Field Spectroradiometer

December 8, 2014 12:43 pm | Product Releases | Comments

Spectral Evolution’s PSR+ full-range NIR field spectroradiometer features a small footprint and enhanced performance for remote sensing applications. The PSR+ has a new compact design that makes it sleeker for easier handling and use in the field.

LISTED UNDER: SPECTROMETRY AND SPECTROSCOPY | Spectrometers | Spectrometry/Spectroscopy

Mass Spectrometers for Studying Dissolved Gases in Aqueous Solutions

December 8, 2014 10:40 am | Hiden Analytical, Inc. | Product Releases | Comments

Hiden Analytical has introduced the HPR-40 mass spectrometer series, engineered specifically for monitoring dissolved gaseous content in aqueous solutions. All systems feature a media interface with semi-permeable membrane to enrich the transition of gases and vapors and simultaneously inhibit the transfer of water vapor.


UV-Vis-NIR Polarization Spectroscopy

November 25, 2014 9:44 am | CRAIC Technologies | Product Releases | Comments

Craic Technologies has introduced UV-Vis-NIR polarization spectroscopy capabilities to Craic microspectrophotometers. This feature is offered as a package that allows the user to measure polarization spectra in either transmission or reflectance modes.


SIMS Surface Analyzers

November 24, 2014 10:42 am | Product Releases | Comments

Secondary ion mass spectrometry (SIMS) is a versatile, highly selective technique for compositional analysis of surfaces from the atomic level through to depths of 100s of nanometers. Hiden Analytical has extended their series of SIMS systems to offer the choice of equipment specification levels to suit a broad spread of budget capacities while maintain the potential to subsequently expand to the top-level specification.

LISTED UNDER: ANALYSIS INSTRUMENTS | Surface Analyzers | Surface Area

Spectral Surface Mapping Software for Microspectrophotometers

November 7, 2014 3:29 pm | Product Releases | Comments

CRAIC Technologies offers Spectral Surface Mapping (S2M) capabilities for its UV-visible-NIR microspectrophotometers.


Gas Analyzer Ideal for Continuous Flow Monitoring

November 6, 2014 3:07 pm | Product Releases | Comments

The MAX300-EGA from Extrel, designed for evolved gas analysis, delivers precision, stability, speed and flexibility for the analysis of off-gas from a thermal analyzer (TGA) or other continuous flow system.

LISTED UNDER: Mass, Quadrupole


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