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TEM (Transmission Electron Microscope)

Ultra-fast Electron Microscope

October 31, 2013 8:52 am | Product Releases | Comments

FEI has introduced the Tecnai Femto ultra-fast electron microscope (UEM), enabling scientists to explore ultra-fast events and processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | TEM (Transmission Electron Microscope)
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High-throughput TEM Sample Preparation Workflow

October 30, 2013 8:55 am | Product Releases | Comments

FEI has introduced ExSolve, an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep increases the speed of sample preparation, providing semiconductor and data storage manufacturers with quick and easy access to the data they need to verify and monitor process performance.

LISTED UNDER: TEM (Transmission Electron) | TEM-Supplies | TEM (Transmission Electron Microscope)

TEM for High-Contrast Applications

August 6, 2013 9:16 am | Product Releases | Comments

JEOL USA has introduced the JEM-1400Plus, a 120-kV transmission electron microscope (TEM). The JEM-1400Plus TEM features high-resolution/high-contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3-D tomography and montaging.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

TEMs for Materials Science Research

August 5, 2013 8:56 am | Product Releases | Comments

FEI Co. has introduced three systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The systems provide efficient and effective application-specific workflows for semiconductor manufacturing and scientific research.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

FEI introduces two new DualBeams for materials science

July 18, 2013 1:28 pm | Product Releases | Comments

Two new DualBeam systems from FEI feature innovative detection suites to provide high-quality imaging and fast analysis. The Scios DualBeam is specifically positioned for fast 2-D and 3-D characterization. The Helios NanoLab 660 DualBeam adds capabilities for specialized applications, such as the fabrication of prototypes for nanometer-scale devices.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

TEM for Structural Biology Research

February 5, 2013 8:39 am | Product Releases | Comments

FEI has introduced the Tecnai Arctica transmission electron microscope (TEM) for structural biology research. The TEM incorporates automation, pioneered on FEI’s Titan Krios TEM, to elucidate the 3D structure of biological macromolecules and molecular complexes.

LISTED UNDER: TEM (Transmission Electron Microscope)

Platform for High-Productivity TEM Sample Prep

August 29, 2012 4:46 am | Product Releases | Comments

FEI Company has introduced new Helios NanoLab DualBeam systems—the 450HP and 1200HP DualBeam systems. The systems include new capabilities that meet the requirements for semiconductor process development at the 28 nm device geometry node and below.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

Environmental Transmission Electron Microscope

July 25, 2012 5:13 am | Product Releases | Comments

FEI Company has introduced the Titan ETEM G2, an environmental transmission electron microscope (ETEM) that enables time-resolved, in-situ studies of processes and materials exposed to reactive gases and elevated temperatures.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

Transmission electron microscope

May 10, 2011 4:24 am | Product Releases | Comments

JEOL’s atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, rapidly resumes operation after flashing.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

New JEOL TEM quickly breaks into picoscale territory

February 19, 2010 1:00 am | Product Releases | Comments

 Just three weeks after its installation at the Univ. of Texas San Antonio campus, the latest transmission electron microscope from JEOL delivered data on silicon samples that resolved down to 78 picometers, a level that enables atom-by-atom chemical mapping.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras
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