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Automated UV-Vis-NIR Spectroscopy

August 7, 2013 8:58 am | Product Releases | Comments

Craic Technologies has introduced the automated version of its 20/30 Perfect Vision UV-visible-NIR microspectrophotometer. The system is designed to be fully programmable with touchscreen controls so that it can automatically analyze microscopic sample with UV-Vis-NIR spectroscopy and microscopy.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | UV-VIS-NIR | Spectrometry/Spectroscopy

TEM for High-Contrast Applications

August 6, 2013 9:16 am | Product Releases | Comments

JEOL USA has introduced the JEM-1400Plus, a 120-kV transmission electron microscope (TEM). The JEM-1400Plus TEM features high-resolution/high-contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3-D tomography and montaging.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

TEMs for Materials Science Research

August 5, 2013 8:56 am | Product Releases | Comments

FEI Co. has introduced three systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The systems provide efficient and effective application-specific workflows for semiconductor manufacturing and scientific research.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras
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FEI introduces two new DualBeams for materials science

July 18, 2013 1:28 pm | Product Releases | Comments

Two new DualBeam systems from FEI feature innovative detection suites to provide high-quality imaging and fast analysis. The Scios DualBeam is specifically positioned for fast 2-D and 3-D characterization. The Helios NanoLab 660 DualBeam adds capabilities for specialized applications, such as the fabrication of prototypes for nanometer-scale devices.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

Small-form-factor Diffraction Gratings

July 18, 2013 1:24 pm | Product Releases | Comments

Headwall Photonics, Inc. has introduced high-performance small-form-factor diffraction gratings for use by OEM-specific applications in precision optical instruments. Headwall's gratings are used in wide range of spectroscopy applications, including near-infrared, hyperspectral and Raman.

LISTED UNDER: X-Ray Equipment, Diffractometers | Microscopes, Optics, Image Analysis, Lasers, Cameras | Diffraction, X-Ray

Mid-IR Bandpass Filters

July 16, 2013 1:39 pm | Product Releases | Comments

Alluxa has announced a new line of high performance durable hard coated, mid-infrared bandpass filters and multi-bandpass filters featuring ultra-high transmission and no measurable absorption in the water band.

LISTED UNDER: IR | Microscopes, Optics, Image Analysis, Lasers, Cameras

Image Analysis Software

July 1, 2013 9:17 am | Product Releases | Comments

Craic Technologies has introduced ImageUV microscope camera control and image analysis software for Windows 8. Scientists and engineers using ImageUV running on Windows 8 will notice a more fluid response, with Window 8’s enhanced stability and advanced memory management.

LISTED UNDER: Image Analysis and Image Processing Software | Other Microscope Supplies | Microscopes, Optics, Image Analysis, Lasers, Cameras

Scanning Microwave Microscopy Mode

June 25, 2013 8:24 am | Agilent Technologies Inc. | Product Releases | Comments

Agilent Technologies Inc. has announced the availability of scanning microwave microscopy (SMM) capabilities for its high-performance atomic force microscope, the 5500 AFM. Agilent’s second-generation SMM nose cone makes this electrical measurement option compatible with the 5500 system.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras
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Microscope Cameras for Brightfield, Fluorescence Applications

June 21, 2013 8:33 am | Product Releases | Comments

Leica Microsystems has introduced two cameras suited for routine brightfield or fluorescence applications. Both cameras are equipped with sensors dedicated to the respective applications that allow live images of up to 30 fps and a USB 3.0 interface for fast data transfer. The Leica Application Suite (LAS) and the fluorescence counterpart LAS Advanced Fluorescence (LAS AF) software platform provide for image acquisition and support users in analysis and documentation.

LISTED UNDER: CCD | Microscopes, Optics, Image Analysis, Lasers, Cameras

Optical Gas Imaging Camera

June 20, 2013 8:11 am | Product Releases | Comments

FLIR Systems offers the FLIR GF320 optical gas imaging camera to aid the oil and gas industries better control hydrocarbon emissions, preserving the environment and improving operational safety. The real-time infrared camera is designed for use in harsh industrial environments.

LISTED UNDER: IR | Microscopes, Optics, Image Analysis, Lasers, Cameras

Digital High-Speed Cameras

June 14, 2013 8:34 am | Vision Research | Product Releases | Comments

Vision Research has expanded its line of Phantom Miro cameras to include a ruggedized body style. The Phantom Miro R-Series is targeted at applications in harsh environments where the camera must survive high shock and vibration, as well as a range of operating temperatures.

LISTED UNDER: Digital and High Resolution | High Speed | Microscopes, Optics, Image Analysis, Lasers, Cameras

Z-axis Elevator Stage

June 13, 2013 8:51 am | Product Releases | Comments

Piezosystem jena has introduced the PZ 300 piezoelectric actuator-based z-axis elevator stage for standard and inverted microscopes. The monolithic stage design is free of mechanical play and offers a travel range of up to 300 microns with a step resolution of ±2.5 nm.

LISTED UNDER: Stages | Microscopes, Optics, Image Analysis, Lasers, Cameras

Cooled Thermal Imaging Cameras

June 12, 2013 12:08 pm | Product Releases | Comments

FLIR Systems has introduced a new range of thermal imaging cameras optimized for industrial R&D applications. FLIR A3500sc/A6500sc series thermal imaging cameras incorporate a cooled 3 to 5 micron MW-IR detector. Achieving a high thermal sensitivity of <25 mK, the cameras are able to capture fine image details and temperature difference information.

LISTED UNDER: IR | Microscopes, Optics, Image Analysis, Lasers, Cameras

CMOS-based X-ray Camera Models

June 12, 2013 11:54 am | Product Releases | Comments

Teledyne DALSA has introduced two new models—Shad-o-Box 512 HS and Shad-o-Box 1024 HS—in its Shad-o-Box x-ray detector product line. The models feature active areas of 10.4 by 6.9 cm (768 by 512 pixels) and 10.4 by 13.9 cm (768 by 1024 pixels), respectively. Both models use a 135 µm pixel size.

LISTED UNDER: X-ray Cameras | Microscopes, Optics, Image Analysis, Lasers, Cameras

Full-Wafer DualBeam Analysis System

June 6, 2013 7:58 am | Product Releases | Comments

FEI Co. has introduced the Helios NanoLab 1200AT, the newest generation of its full-wafer DualBeam analysis systems. The addition of an optional automated FOUP (front opening universal pod) loader allows location of the Helios NanoLab 1200AT system inside the semiconductor wafer fab.

LISTED UNDER: SEM | Metrology

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