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Filter Wheel Deck for Inverted Microscopes

April 24, 2013 11:51 am | Product Releases | Comments

Prior Scientific has introduced the HF108IX3 filter wheel deck designed for Olympus IX3 inverted microscope systems. Simple cassette-like insertion into the side deck of the Olympus IX3 makes installation quick and easy.

LISTED UNDER: Filter Wheels | Microscopes, Optics, Image Analysis, Lasers, Cameras
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Single-Frequency Lasers

April 23, 2013 8:58 am | Product Releases | Comments

The Mephisto family of single-frequency lasers from Coherent Inc. offer ultranarrow linewidth (1 kNz over 100 ms) that is suited for applications such as atom trapping and cooling and optical heterodyning.

LISTED UNDER: Other Laser Systems

Digital HD Microscope Cameras

April 16, 2013 9:23 am | Product Releases | Comments

Leica Microsystems has introduced the Leica MC120 HD and MC170 HD digital microscope cameras, high-performance cameras that provide high-speed, precise images in real time at a rate of up to 30 frames per second.

LISTED UNDER: Digital and High Resolution | High Speed | Microscopes, Optics, Image Analysis, Lasers, Cameras

Raman Microscope

April 15, 2013 9:39 am | Product Releases | Comments

Horiba Scientific has introduced the XploRA ONE Raman microscope, which offers "one-shot" full spectral analysis and programmable measurement templates for Raman analysis and identification of samples.

LISTED UNDER: Raman

New AFM Semiconductor Characterization Solution

April 5, 2013 6:14 pm | Product Releases | Comments

Bruker recently announced the release of the Dimension Icon SSRM-HR, a new atomic force microscope (AFM) configuration including the Scanning Spreading Resistance Microscopy (SSRM) module, designed specifically for high-resolution (HR) semiconductor characterization.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Microspectrophotometer

April 4, 2013 8:36 am | Product Releases | Comments

Craic Technologies has introduced the 20/30 PV microspectrophotometer which is designed to non-destructively analyze microscopic samples from the deep ultraviolet to the near infrared by several techniques.

LISTED UNDER: Other Microscopes | Microscopes, Optics, Image Analysis, Lasers, Cameras | Spectrophotometers

Silicon Drift Detectors

March 21, 2013 4:59 pm | Product Releases | Comments

EDAX Inc. has introduced the Octane Series silicon drift detectors (SDD) for its TEAM EDS analysis system on electron microscopes. By incorporating advancements in SDD technology, the Octane SDD family delivers high-quality EDS data at previously unachievable speeds. The Octane Series includes four models—the Pro, Plus, Super, and Ultra—that are designed specifically to meet the demands of key microanalysis applications.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Meters, Monitors, & Electrochemical Equipment

EBSD Camera

March 21, 2013 4:44 pm | Product Releases | Comments

EDAX has introduced the Hikari XP, an EBSD camera. The camera offers high performance across the complete range of EBSD applications, from high-speed analysis for process development and quality control to high-sensitivity indexing at low beam currents and low accelerating voltages for improved spatial resolution.

LISTED UNDER: High Speed | Microscopes, Optics, Image Analysis, Lasers, Cameras

Acoustic Enclosure for SEMs

March 20, 2013 4:48 pm | Product Releases | Comments

TMC, a unit of Ametek Ultra Precision Technologies, has introduced SEM-closure, an acoustic enclosure designed for scanning electron microscopes (SEM). TMC's STACIS iX SEM-Base active piezoelectric vibration cancellation floor platform cancels vibration at very low frequencies. Its Mag-NetX cancels magnetic field interference.

LISTED UNDER: SEM (Scanning Electron Microscope) Supplies | Microscopes, Optics, Image Analysis, Lasers, Cameras

Raman Microscope for QA/QC

March 15, 2013 8:32 am | Product Releases | Comments

Horiba Scientific has introduced the XploRA ONE Raman microscope, which offers simplicity, high sensitivity, and reliability for QA/QC and analytical laboratories in the industrial and routine analytical sectors. The Raman microscope offers one-shot full spectral analysis and programmable measurement templates for the Raman analysis and identification of samples, which translates to simple operation from acquisition to reporting.

LISTED UNDER: Raman

Automatic Screen Printer for Microscope Slides

March 8, 2013 4:04 pm | Product Releases | Comments

Systematic Automation Inc. has developed a fully automatic screen printer for microscope slides or other flat glass. The machine loads, registers, cleans, screen prints, and densely populates trays in rows of printed slides.

LISTED UNDER: Other Microscope Supplies | Projector Screens | Slides

Digital HD Microscope Cameras

February 27, 2013 8:20 am | Product Releases | Comments

Leica Microsystems has introduced the Leica MC120 HD and MC170 HD cameras, high-performance cameras that provide high-speed, precise images in real time at a rate of up to 30 frames per second.

LISTED UNDER: High Speed | Digital Microscopes | Microscopes, Optics, Image Analysis, Lasers, Cameras

Imaging Particle Analysis Instrumentation

February 26, 2013 3:34 pm | Product Releases | Comments

Fluid Imaging Technologies' At-Line FlowCAM ES imaging particle analysis system automatically extracts, dilutes, and runs samples from within production or processing lines.

LISTED UNDER: In-Line Analyzers | Particle Concentration Analyzers | Analyzers, Image

Confocal Raman Microscope

February 26, 2013 3:19 pm | Product Releases | Comments

The Nomadic from BaySpec Inc. is a dispersive confocal Raman microscope equipped with three-laser excitation from visible to NIR. The research-grade Raman microscope offers high sensitivity and speed by using BaySpec VPG technology; ultrafast electronics; and high-sensitivity, deep-cooled CCD and InGaAs detectors for a full spectral range of 400 to 1,700 nm.

LISTED UNDER: Confocal | Raman | Microscopes, Optics, Image Analysis, Lasers, Cameras

Correlative Light and Electron Microscopy

February 26, 2013 2:38 pm | Product Releases | Comments

Carl Zeiss will exhibit a range of high-performance optical and electron microscopy products at Pittcon 2013. Included in the display will be Carl Zeiss' software for correlative microscopy in materials analysis, which enhances electron beam lithography workflow by bridging the electron and florescent light microscopy systems together.

LISTED UNDER: Electron Scanning | Optical | Other Microscopes

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