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Photometrics DV2 Two-Channel Simultaneous-Imaging System

August 15, 2013 12:36 pm | Photometrics | Products

The DV2 is an emission splitting system enabling a user to acquire two spatially identical but spectrally distinct images simultaneously. Simultaneous, multichannel imaging is essential for researchers needing to directly compare each of the two image channels. This comparison can be in the form of colocalization analysis, emission ratiometric analysis or polarization studies of single wavelength channel. Primary Applications Include: Multicolor TIRF; FRET; Polarization/Anisotropy; Fluorescence Biosensors; 3D Particle Tracking via Bifocal Imaging; Simultaneous Fluorescence/DIC

LISTED UNDER: CCD | Digital and High Resolution | High-Speed

Photometrics DC2 Two-Channel, Full Field, Simultaneous Imaging System

August 15, 2013 12:35 pm | Photometrics | Products

The DC2 is an emission splitting system enabling a user to acquire two spatially identical but spectrally distinct images simultaneously. Simultaneous, multichannel imaging is essential to directly compare each of the two image channels. This comparison can be in the form of colocalization analysis, emission ratiometric analysis or polarization studies of single wavelength channel. Primary Applications Include: High Content Screening; Multicolor TIRF; Polarization/Anisotropy; Fluorescence Biosensors; FRET; Simultaneous Fluorescence/DIC

LISTED UNDER: CCD | Digital and High Resolution | High-Speed

Photometrics QV2 Multi-Channel Imaging System

August 15, 2013 12:33 pm | Photometrics | Products

The QV2 allows simultaneous acquisition of up to four emission channels in a single exposure. It uses a series of beamsplitters to split the emission light from the microscope into four separate channels. Each channel is then projected onto one quadrant of the CCD at exactly the same moment in time. Simultaneous multichannel imaging is essential to achieve quantitative ratiometric imaging. Primary Applications Include: Three-color Fluorescence and DIC; Two-color Polarization/Anisotropy Studies; Simultaneous Calcium and pH Studies with Indo-1 and SNARF; FRET; Quantum Dot Imaging

LISTED UNDER: CCD | Digital and High Resolution | IR
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Full Motion Video Spectral Imaging System

August 15, 2013 8:58 am | Product Releases | Comments

Surface Optic Corp. offers the Full Motion Video–Spectral Imaging (FMV-SI) system, a system that simultaneously captures and processes all three dimensions of a spectral cube at 60-Hz video rates through a plenoptic-based design using a single focal plane array.

LISTED UNDER: Digital and High Resolution | Microscopes, Optics, Image Analysis, Lasers, Cameras

Z-axis Piezo Elevator Stage for Microscope Integration

August 14, 2013 11:30 am | Product Releases | Comments

piezosystem jena has introduced the PZ 250 SG Z-axis piezo elevator stage designed for precise positioning of probes and components under a microscope. The PZ 250 SG consists of a bottom plate prepared according to the microscope stage footprint size making integration easy.

LISTED UNDER: Stages | Stages, Nanopositioning | Microscopes, Optics, Image Analysis, Lasers, Cameras

Automated UV-Vis-NIR Spectroscopy

August 7, 2013 8:58 am | Product Releases | Comments

Craic Technologies has introduced the automated version of its 20/30 Perfect Vision UV-visible-NIR microspectrophotometer. The system is designed to be fully programmable with touchscreen controls so that it can automatically analyze microscopic sample with UV-Vis-NIR spectroscopy and microscopy.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | UV-VIS-NIR | Spectrometry/Spectroscopy

TEM for High-Contrast Applications

August 6, 2013 9:16 am | Product Releases | Comments

JEOL USA has introduced the JEM-1400Plus, a 120-kV transmission electron microscope (TEM). The JEM-1400Plus TEM features high-resolution/high-contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3-D tomography and montaging.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

TEMs for Materials Science Research

August 5, 2013 8:56 am | Product Releases | Comments

FEI Co. has introduced three systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The systems provide efficient and effective application-specific workflows for semiconductor manufacturing and scientific research.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras
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FEI introduces two new DualBeams for materials science

July 18, 2013 1:28 pm | Product Releases | Comments

Two new DualBeam systems from FEI feature innovative detection suites to provide high-quality imaging and fast analysis. The Scios DualBeam is specifically positioned for fast 2-D and 3-D characterization. The Helios NanoLab 660 DualBeam adds capabilities for specialized applications, such as the fabrication of prototypes for nanometer-scale devices.

LISTED UNDER: TEM (Transmission Electron Microscope) | Microscopes, Optics, Image Analysis, Lasers, Cameras

Small-form-factor Diffraction Gratings

July 18, 2013 1:24 pm | Product Releases | Comments

Headwall Photonics, Inc. has introduced high-performance small-form-factor diffraction gratings for use by OEM-specific applications in precision optical instruments. Headwall's gratings are used in wide range of spectroscopy applications, including near-infrared, hyperspectral and Raman.

LISTED UNDER: X-Ray Equipment, Diffractometers | Microscopes, Optics, Image Analysis, Lasers, Cameras | Diffraction, X-Ray

Mid-IR Bandpass Filters

July 16, 2013 1:39 pm | Product Releases | Comments

Alluxa has announced a new line of high performance durable hard coated, mid-infrared bandpass filters and multi-bandpass filters featuring ultra-high transmission and no measurable absorption in the water band.

LISTED UNDER: IR | Microscopes, Optics, Image Analysis, Lasers, Cameras

Image Analysis Software

July 1, 2013 9:17 am | Product Releases | Comments

Craic Technologies has introduced ImageUV microscope camera control and image analysis software for Windows 8. Scientists and engineers using ImageUV running on Windows 8 will notice a more fluid response, with Window 8’s enhanced stability and advanced memory management.

LISTED UNDER: Image Analysis and Image Processing Software | Other Microscope Supplies | Microscopes, Optics, Image Analysis, Lasers, Cameras

Scanning Microwave Microscopy Mode

June 25, 2013 8:24 am | Agilent Technologies Inc. | Product Releases | Comments

Agilent Technologies Inc. has announced the availability of scanning microwave microscopy (SMM) capabilities for its high-performance atomic force microscope, the 5500 AFM. Agilent’s second-generation SMM nose cone makes this electrical measurement option compatible with the 5500 system.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Microscope Cameras for Brightfield, Fluorescence Applications

June 21, 2013 8:33 am | Product Releases | Comments

Leica Microsystems has introduced two cameras suited for routine brightfield or fluorescence applications. Both cameras are equipped with sensors dedicated to the respective applications that allow live images of up to 30 fps and a USB 3.0 interface for fast data transfer. The Leica Application Suite (LAS) and the fluorescence counterpart LAS Advanced Fluorescence (LAS AF) software platform provide for image acquisition and support users in analysis and documentation.

LISTED UNDER: CCD | Microscopes, Optics, Image Analysis, Lasers, Cameras

Optical Gas Imaging Camera

June 20, 2013 8:11 am | Product Releases | Comments

FLIR Systems offers the FLIR GF320 optical gas imaging camera to aid the oil and gas industries better control hydrocarbon emissions, preserving the environment and improving operational safety. The real-time infrared camera is designed for use in harsh industrial environments.

LISTED UNDER: IR | Microscopes, Optics, Image Analysis, Lasers, Cameras

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