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Multipoint Scanning Confocal Microscope

December 16, 2013 3:07 pm | Product Releases | Comments

At the 2013 American Society for Cell Biology Annual Meeting, Bruker introduced the Opterra Multipoint Scanning Confocal Microscope, which integrates confocal microscopy with photoactivation capabilities for applications in biology.

LISTED UNDER: Confocal

AFM System

December 11, 2013 8:46 am | Product Releases | Comments

JPK Instruments has released its next generation of NanoWizard AFM systems, providing fast scanning and super-resolution on an inverted microscope. The fast-scanning NanoWizard ULTRA Speed AFM is important to users as it enables the tracking of changes in samples in real time, whether the sample be imaged in air or liquid.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

High-throughput Serial Block Face Imaging

December 11, 2013 8:42 am | Product Releases | Comments

JEOL Ltd. has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers are now able to image 3-D structures of biological and materials samples at ultra-high resolution using the JEOL JSM-7100F field emission scanning electron microscope with an integrated Gatan 3View Serial Block Face imaging system.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras
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Atomic Force Microscope

December 4, 2013 9:46 am | Agilent Technologies Inc. | Product Releases | Comments

Agilent Technologies Inc. has introduced its 7500 atomic force microscope (AFM), an advanced instrument that achieves atomic resolution imaging with its 90 um AFM closed-loop scanner. The microscope platform is designed to extend the frontier of atomic force microscopy for academia and industry by offering high resolution and precise environmental and temperature control.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Field Emission Scanning Electron Microscopes

November 26, 2013 11:11 am | Product Releases | Comments

Carl Zeiss Microscopy LLC has introduced its new Crossbeam series. The newly developed focused ion beam (FIB) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real time. High resolution over the entire voltage and current range allows users to work quickly and precisely.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | SEM

Hardware Auto Focus and Cleanroom Kit

November 19, 2013 8:57 am | Product Releases | Comments

Carl Zeiss Microscopy LLC has introduced its Hardware Auto Focus and cleanroom kit for the Axio Imager Vario microscope system. The Hardware Auto Focus is suitable for surface inspections on reflective, low-contrast samples.

LISTED UNDER: Other Microscope Supplies

Virtual Microscope Images a Touch Away

November 12, 2013 9:54 am | Product Releases | Comments

Researchers and educators who use images captured in the Olympus virtual slide format will soon be able to gain access to their entire library of virtual microscope images from anywhere with a tap of the finger, thanks to the OlyVIA Mobile iPad App, a free download from the Apple Store/iTunes.

LISTED UNDER: Other Microscope Supplies

QImaging optiMOS™ Scientific CMOS Camera

November 7, 2013 6:47 pm | QImaging | Products

This new Scientific CMOS camera is optimized for fluorescence microscopy. optiMOS delivers 10x the time resolution of CCD cameras without trading off on resolution or sensitivity. An alternative to traditional CCD cameras, optiMOS, combines speed with high resolution and increased sensitivity. The affordable sCMOS solution, optiMOS brings the advantages of low noise and high speed imaging to a broader range of cell biology applications. optiMOS is ideally suited for cell biologists using live cell, multicolor fluorescence; biophysicists studying membrane dynamics and protein and lipid trafficking; as well as neuroscientists looking at ion transport such as electrophysiology, calcium imaging and ratiometric imaging.

LISTED UNDER: Digital and High Resolution | High-Speed
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Ultra-fast Electron Microscope

October 31, 2013 8:52 am | Product Releases | Comments

FEI has introduced the Tecnai Femto ultra-fast electron microscope (UEM), enabling scientists to explore ultra-fast events and processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | TEM (Transmission Electron Microscope)

High-throughput TEM Sample Preparation Workflow

October 30, 2013 8:55 am | Product Releases | Comments

FEI has introduced ExSolve, an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep increases the speed of sample preparation, providing semiconductor and data storage manufacturers with quick and easy access to the data they need to verify and monitor process performance.

LISTED UNDER: TEM (Transmission Electron) | TEM Supplies | TEM (Transmission Electron Microscope)

3-D Confocal Super-resolution Microscope

October 24, 2013 9:42 am | Product Releases | Comments

Leica Microsystems has extended the capabilities of confocal super-resolution with its Leica TCS SP8 STED 3X. The 3-D STED system Leica TCS SP8 STED 3X achieves resolutions below the diffraction limit in lateral as well as axial directions.

LISTED UNDER: Confocal | Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes

Low-profile Scanning Stages

October 24, 2013 9:39 am | Product Releases | Comments

Zaber Technologies has introduced a new xy scanning stage equipped with built-in rotary encoders for closed-loop operation. The ASR-E stages are designed for use with most common microscopes including Leica, Nikon, Olympus and Zeiss.

LISTED UNDER: Stages

Fixed-focus Thermal Imaging Lenses

October 23, 2013 9:25 am | Product Releases | Comments

Offered in a choice of 40-, 80- or 120-mm focal lengths, the Resolve Optics Model 320 fixed-focus infrared (IR) lens combines high quality, high throughput, compactness and robustness into one lens.

LISTED UNDER: IR

Automated Probe Calibration

October 23, 2013 9:18 am | Asylum Research | Product Releases | Comments

Asylum Research has introduced the GetReal automated probe calibration feature. With one click GetReal calibrates an atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results.

LISTED UNDER: AFM Supplies | Other Microscope Supplies

Contact Resonance Viscoelastic Mapping Mode

October 21, 2013 9:21 am | Asylum Research | Product Releases | Comments

Asylum Research has introduced the Contact Resonance Viscoelastic Mapping Mode, an option available for Asylum’s Cypher and MFP-3D atomic force microscopes. Contact resonance enables high resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus.

LISTED UNDER: AFM Supplies | Other Microscope Supplies | Atomic Force

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