Microscope Color Calibration Software

May 2, 2014 9:33 am | Product Releases | Comments

Datacolor CHROMACAL image calibration software offers expanded features in delivering color accuracy for brightfield microscope images. Version 1.1 of CHROMACAL includes automated white balance, the ability to handle JPEG images and more.

LISTED UNDER: Image Analysis and Image Processing Software | Other Microscope Supplies

High-performance Atomic Force Microscope

April 22, 2014 9:35 am | Asylum Research | Product Releases | Comments

Oxford Instruments Asylum Research has introduced the MFP-3D Infinity atomic force microscope (AFM). The MFP-3D Infinity features a large 90-um stage and entirely new control electronics that are located close to the AFM for fast, low-noise performance.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

CMOS Line Scan Cameras

April 11, 2014 8:43 am | Product Releases | Comments

Teledyne DALSA has introduced a new family of line scan cameras—the Linea series. The feature-rich Linea cameras address the mainstream market for machine vision applications by delivering high speed and flexibility in a compact form factor.


Compact Measurement System for 300-mm Optics

April 10, 2014 9:45 am | Product Releases | Comments

4D Technology has introduced a suite of products for high-quality, low-cost measurement of 300-m diameter optics. The suite of 300-mm components includes a compact, high-performance 100- to 300-mm Beam Expander which can be used in horizontal or look-down measurement configurations.

LISTED UNDER: Accessories

Thermal Imaging Camera

April 10, 2014 9:42 am | Product Releases | Comments

FLIR Systems has introduced an enhanced version of its T650sc thermal imaging camera. Engineered for R&D the FLIR T650sc combines high accuracy (+/- 1 C) and sensitivity to routinely deliver accurate measurement of temperature differences (less than 20 mK).

LISTED UNDER: Infrared Thermal Analyzers | IR

Microscope System Sets New Standards in 3-D Nanotomography

March 21, 2014 9:53 am | Product Releases | Comments

Carl Zeiss has introduced a new system in its Crossbeam series family. The focused ion beam (FID) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real time.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | SEM

Raman Microscope Enables High-resolution Materials Analysis

March 6, 2014 4:35 pm | Thermo Fisher Scientific | Product Releases | Comments

Thermo Fisher Scientific has introduced the DXRxi Raman imaging microscope, an easy-to-operate Raman microscope for scientists of all abilities. Scientists can walk up and use it to produce chemical images without learning a new technique.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Raman | Raman

Thermal Cameras Spot Leaks

February 18, 2014 10:02 am | Product Releases | Comments

Designed as a preventative maintenance solution for the oil and gas industry, the GF320 optical gas imaging (OGI) camera from FLIR Systems provides an easy-to-use tool for spotting leaks in tanks, pipelines and facilities. As a result, the camera improves safety and profitability as well as minimizing emissions with less risk of business interruption due to actions from regulatory agencies.


Second-generation AFM-based IR Spectroscopy Platform

February 4, 2014 4:17 pm | Product Releases | Comments

Anasys Instruments has introduced the nanoIR2, a second-generation AFM-based infrared (AFM-IR) spectroscopy platform. A key breakthrough is the ability of the nanoIR2 to operate with top-side illumination, eliminating the need to prepare samples on a ZnSe prism and enabling measurements on a much more diverse set of samples.

LISTED UNDER: Analytical Instrumentation | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

SEM Features 4-Axis Motorized Stage

February 4, 2014 3:17 pm | Product Releases | Comments

Hitachi High Technologies America's Model SU3500 VP-SEM system is available with a four-axis motorized stage, in addition to the existing five-axis motorized stage system. The four-axis version is targeted for smaller sample applications. The SU35000 SEM (scanning electron microscope) features innovative electron optics and signal detection systems offering high-resolution imaging and excellent analytical performance.

LISTED UNDER: Stages | Microscopes, Optics, Image Analysis, Lasers, Cameras | SEM

Raman Microscope

February 4, 2014 3:12 pm | HORIBA Scientific | Product Releases | Comments

Horiba Scientific's XploRA PLUS incorporates innovative and powerful functions in a high-performance system. It is fully confocal, so it doesn't compromise image quality, spatial or depth resolution. The SWIFT Fast Raman imaging offers detailed Raman images. Sensitivity and speed is excellent using deep-cooled CCD detector technology, reducing the amount of laser energy required for each analysis, offering true non-destructive sample testing and preserving delicate samples.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Raman

Benchtop SEM

February 4, 2014 3:01 pm | Product Releases | Comments

The JEOL NeoScope II benchtop SEM is a suitable complement to light microscopy. With high benchtop magnification and resolution, its space-saving design gives users the power of scanning electron microscopy in a compact package. Users can view samples and capture images at a magnification range of 10X to 60,000X.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | Portable Microscopes

High-resolution Digital Microscope

February 4, 2014 2:21 pm | KEYENCE Corporation | Product Releases | Comments

The VHX Series digital microscope, from KEYENCE, is designed to alleviate the shortcomings of traditional, optical light microscopes such as shallow depth of field, short working distance lack of portability/versatility and sample limitations. By integrating advanced zoom optics with a CCD camera, 17-in LCD monitor, light source, electronics and analysis/reporting software, the VHX streamlines testing and improves the speed and efficiency of the inspection process.

LISTED UNDER: Digital Microscopes

XY Microscope Stage

February 4, 2014 12:54 pm | Product Releases | Comments

Zaber Technologies' ASR XY microscope stages can be used either as replacements for the manual stage on microscopes, or as standalone xy scanning stages. Their low profile (42-mm overall height) and excellent flatness suit them for many applications.


Acoustic Component Scanner

February 3, 2014 12:57 pm | Product Releases | Comments

Sonoscan has introduceed the Model DF2400 in its FACTS2 line of C-SAM acoustic microscopes. The key features include up to seven times increase in throughput over previous systems and an automated platform quickly convertible for performing full laboratory analysis.



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