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Microscopes, Optics, Image Analysis, Lasers, Cameras

High-performance Atomic Force Microscope

April 22, 2014 9:35 am | Asylum Research | Product Releases | Comments

Oxford Instruments Asylum Research has introduced the MFP-3D Infinity atomic force microscope (AFM). The MFP-3D Infinity features a large 90-um stage and entirely new control electronics that are located close to the AFM for fast, low-noise performance.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras
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Microscope System Sets New Standards in 3-D Nanotomography

March 21, 2014 9:53 am | Product Releases | Comments

Carl Zeiss has introduced a new system in its Crossbeam series family. The focused ion beam (FID) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real time.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | SEM

Raman Microscope Enables High-resolution Materials Analysis

March 6, 2014 4:35 pm | Thermo Fisher Scientific | Product Releases | Comments

Thermo Fisher Scientific has introduced the DXRxi Raman imaging microscope, an easy-to-operate Raman microscope for scientists of all abilities. Scientists can walk up and use it to produce chemical images without learning a new technique.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Raman | Raman

Second-generation AFM-based IR Spectroscopy Platform

February 4, 2014 4:17 pm | Product Releases | Comments

Anasys Instruments has introduced the nanoIR2, a second-generation AFM-based infrared (AFM-IR) spectroscopy platform. A key breakthrough is the ability of the nanoIR2 to operate with top-side illumination, eliminating the need to prepare samples on a ZnSe prism and enabling measurements on a much more diverse set of samples.

LISTED UNDER: Analytical Instrumentation | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

SEM Features 4-Axis Motorized Stage

February 4, 2014 3:17 pm | Product Releases | Comments

Hitachi High Technologies America's Model SU3500 VP-SEM system is available with a four-axis motorized stage, in addition to the existing five-axis motorized stage system. The four-axis version is targeted for smaller sample applications. The SU35000 SEM (scanning electron microscope) features innovative electron optics and signal detection systems offering high-resolution imaging and excellent analytical performance.

LISTED UNDER: Stages | Microscopes, Optics, Image Analysis, Lasers, Cameras | SEM

Raman Microscope

February 4, 2014 3:12 pm | HORIBA Scientific | Product Releases | Comments

Horiba Scientific's XploRA PLUS incorporates innovative and powerful functions in a high-performance system. It is fully confocal, so it doesn't compromise image quality, spatial or depth resolution. The SWIFT Fast Raman imaging offers detailed Raman images. Sensitivity and speed is excellent using deep-cooled CCD detector technology, reducing the amount of laser energy required for each analysis, offering true non-destructive sample testing and preserving delicate samples.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Raman

Benchtop SEM

February 4, 2014 3:01 pm | Product Releases | Comments

The JEOL NeoScope II benchtop SEM is a suitable complement to light microscopy. With high benchtop magnification and resolution, its space-saving design gives users the power of scanning electron microscopy in a compact package. Users can view samples and capture images at a magnification range of 10X to 60,000X.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | Portable Microscopes

Multipoint Scanning Confocal Microscope

December 18, 2013 4:36 pm | Product Releases | Comments

Bruker has introduced the Opterra Multipoint scanning confocal microscope. The microscope utilizes innovative features to obtain the speed of widefield imaging and the resolution of traditional confocal systems, while minimizing phototoxicity, suiting it for gentle and fast confocal imaging of live cell preparations.

LISTED UNDER: Confocal | Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes

AFM System

December 11, 2013 8:46 am | Product Releases | Comments

JPK Instruments has released its next generation of NanoWizard AFM systems, providing fast scanning and super-resolution on an inverted microscope. The fast-scanning NanoWizard ULTRA Speed AFM is important to users as it enables the tracking of changes in samples in real time, whether the sample be imaged in air or liquid.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

High-throughput Serial Block Face Imaging

December 11, 2013 8:42 am | Product Releases | Comments

JEOL Ltd. has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers are now able to image 3-D structures of biological and materials samples at ultra-high resolution using the JEOL JSM-7100F field emission scanning electron microscope with an integrated Gatan 3View Serial Block Face imaging system.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras

Atomic Force Microscope

December 4, 2013 9:46 am | Agilent Technologies Inc. | Product Releases | Comments

Agilent Technologies Inc. has introduced its 7500 atomic force microscope (AFM), an advanced instrument that achieves atomic resolution imaging with its 90 um AFM closed-loop scanner. The microscope platform is designed to extend the frontier of atomic force microscopy for academia and industry by offering high resolution and precise environmental and temperature control.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Field Emission Scanning Electron Microscopes

November 26, 2013 11:11 am | Product Releases | Comments

Carl Zeiss Microscopy LLC has introduced its new Crossbeam series. The newly developed focused ion beam (FIB) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real time. High resolution over the entire voltage and current range allows users to work quickly and precisely.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | SEM

Ultra-fast Electron Microscope

October 31, 2013 8:52 am | Product Releases | Comments

FEI has introduced the Tecnai Femto ultra-fast electron microscope (UEM), enabling scientists to explore ultra-fast events and processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | TEM (Transmission Electron Microscope)

3-D Confocal Super-resolution Microscope

October 24, 2013 9:42 am | Product Releases | Comments

Leica Microsystems has extended the capabilities of confocal super-resolution with its Leica TCS SP8 STED 3X. The 3-D STED system Leica TCS SP8 STED 3X achieves resolutions below the diffraction limit in lateral as well as axial directions.

LISTED UNDER: Confocal | Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes

3-D Surgical Microscopes

October 17, 2013 9:14 am | Product Releases | Comments

Leica Microsystems has introduced 3-D surgical microscopes with TrueVision 3-D technology. By incorporating the digital smart 3-D system inside select models of Leica Microsystems' surgical microscopes, the two companies have eliminated the need for a separate 3-D cart.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes

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