High-performance Atomic Force Microscope

April 22, 2014 9:35 am | Asylum Research | Product Releases | Comments

Oxford Instruments Asylum Research has introduced the MFP-3D Infinity atomic force microscope (AFM). The MFP-3D Infinity features a large 90-um stage and entirely new control electronics that are located close to the AFM for fast, low-noise performance.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Microscope System Sets New Standards in 3-D Nanotomography

March 21, 2014 9:53 am | Product Releases | Comments

Carl Zeiss has introduced a new system in its Crossbeam series family. The focused ion beam (FID) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real time.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | SEM

Raman Microscope Enables High-resolution Materials Analysis

March 6, 2014 4:35 pm | Thermo Fisher Scientific | Product Releases | Comments

Thermo Fisher Scientific has introduced the DXRxi Raman imaging microscope, an easy-to-operate Raman microscope for scientists of all abilities. Scientists can walk up and use it to produce chemical images without learning a new technique.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Raman | Raman

Second-generation AFM-based IR Spectroscopy Platform

February 4, 2014 4:17 pm | Product Releases | Comments

Anasys Instruments has introduced the nanoIR2, a second-generation AFM-based infrared (AFM-IR) spectroscopy platform. A key breakthrough is the ability of the nanoIR2 to operate with top-side illumination, eliminating the need to prepare samples on a ZnSe prism and enabling measurements on a much more diverse set of samples.

LISTED UNDER: Analytical Instrumentation | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

SEM Features 4-Axis Motorized Stage

February 4, 2014 3:17 pm | Product Releases | Comments

Hitachi High Technologies America's Model SU3500 VP-SEM system is available with a four-axis motorized stage, in addition to the existing five-axis motorized stage system. The four-axis version is targeted for smaller sample applications. The SU35000 SEM (scanning electron microscope) features innovative electron optics and signal detection systems offering high-resolution imaging and excellent analytical performance.

LISTED UNDER: Stages | Microscopes, Optics, Image Analysis, Lasers, Cameras | SEM

Raman Microscope

February 4, 2014 3:12 pm | HORIBA Scientific | Product Releases | Comments

Horiba Scientific's XploRA PLUS incorporates innovative and powerful functions in a high-performance system. It is fully confocal, so it doesn't compromise image quality, spatial or depth resolution. The SWIFT Fast Raman imaging offers detailed Raman images. Sensitivity and speed is excellent using deep-cooled CCD detector technology, reducing the amount of laser energy required for each analysis, offering true non-destructive sample testing and preserving delicate samples.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Raman

Benchtop SEM

February 4, 2014 3:01 pm | Product Releases | Comments

The JEOL NeoScope II benchtop SEM is a suitable complement to light microscopy. With high benchtop magnification and resolution, its space-saving design gives users the power of scanning electron microscopy in a compact package. Users can view samples and capture images at a magnification range of 10X to 60,000X.

LISTED UNDER: Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes | Portable Microscopes

High-resolution Digital Microscope

February 4, 2014 2:21 pm | KEYENCE Corporation | Product Releases | Comments

The VHX Series digital microscope, from KEYENCE, is designed to alleviate the shortcomings of traditional, optical light microscopes such as shallow depth of field, short working distance lack of portability/versatility and sample limitations. By integrating advanced zoom optics with a CCD camera, 17-in LCD monitor, light source, electronics and analysis/reporting software, the VHX streamlines testing and improves the speed and efficiency of the inspection process.

LISTED UNDER: Digital Microscopes

Acoustic Component Scanner

February 3, 2014 12:57 pm | Product Releases | Comments

Sonoscan has introduceed the Model DF2400 in its FACTS2 line of C-SAM acoustic microscopes. The key features include up to seven times increase in throughput over previous systems and an automated platform quickly convertible for performing full laboratory analysis.


Raman Microscope

January 28, 2014 12:04 pm | Product Releases | Comments

Designed to quickly reveal molecular structure, chemical composition and sample morphology, the new Thermo Scientific DXRxi Raman imaging microscope can provide insights, identify defects and confirm product quality with a high degree of confidence. By employing the image-centric software interface, users can quickly profile materials through information-rich chemical images.


3-D Optical Microscope for PCB Industry

December 30, 2013 1:11 pm | Product Releases | Comments

Bruker’s ContourSP large panel metrology system more than doubles the measurement throughput of the high-density interconnect (HDI) substrates in multi-chip modules (MCM) over previous generation SP models used by the semiconductor packaging industry. It is specifically designed to measure each layer of the printed circuit board (PCB) panels during manufacturing.

LISTED UNDER: Instrumentation | Optical

Multipoint Scanning Confocal Microscope

December 18, 2013 4:36 pm | Product Releases | Comments

Bruker has introduced the Opterra Multipoint scanning confocal microscope. The microscope utilizes innovative features to obtain the speed of widefield imaging and the resolution of traditional confocal systems, while minimizing phototoxicity, suiting it for gentle and fast confocal imaging of live cell preparations.

LISTED UNDER: Confocal | Microscopes, Optics, Image Analysis, Lasers, Cameras | Other Microscopes

Scanning Electron Microscope

December 17, 2013 2:59 pm | Product Releases | Comments

At M&M 2013, Indianapolis, ZEISS launched the next generation EVO scanning electron microscope (SEM) series for material and life science applications. Improvements in the SEM’s workflow automation, beam deceleration technology, and HD BSE detector can reduce a workflow from more than 400 steps to just 15.

LISTED UNDER: Electron Scanning

Multipoint Scanning Confocal Microscope

December 16, 2013 3:07 pm | Product Releases | Comments

At the 2013 American Society for Cell Biology Annual Meeting, Bruker introduced the Opterra Multipoint Scanning Confocal Microscope, which integrates confocal microscopy with photoactivation capabilities for applications in biology.


AFM System

December 11, 2013 8:46 am | Product Releases | Comments

JPK Instruments has released its next generation of NanoWizard AFM systems, providing fast scanning and super-resolution on an inverted microscope. The fast-scanning NanoWizard ULTRA Speed AFM is important to users as it enables the tracking of changes in samples in real time, whether the sample be imaged in air or liquid.

LISTED UNDER: Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras


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