Microscope Supplies and Accessories

SEM Features 4-Axis Motorized Stage

February 4, 2014 3:17 pm | Product Releases | Comments

Hitachi High Technologies America's Model SU3500 VP-SEM system is available with a four-axis motorized stage, in addition to the existing five-axis motorized stage system. The four-axis version is targeted for smaller sample applications. The SU35000 SEM (scanning electron microscope) features innovative electron optics and signal detection systems offering high-resolution imaging and excellent analytical performance.

LISTED UNDER: Stages | Microscopes, Optics, Image Analysis, Lasers, Cameras | SEM

XY Microscope Stage

February 4, 2014 12:54 pm | Product Releases | Comments

Zaber Technologies' ASR XY microscope stages can be used either as replacements for the manual stage on microscopes, or as standalone xy scanning stages. Their low profile (42-mm overall height) and excellent flatness suit them for many applications.


Zoom Lens for Environments Subject to Radiation

January 27, 2014 9:06 am | Product Releases | Comments

Compact in design, the Model 192 non browning 6X zoom lens from Resolve Optics Ltd is designed to operate in areas subject to radiation. The Model 192 uses special glass that can withstand long-term exposure to radiation up to a dose of 100 million radians and temperatures to 55 C without discoloration.

LISTED UNDER: Other Microscope Supplies

UV LED Light Engines

December 30, 2013 1:08 pm | Product Releases | Comments

Innovations in Optics, Inc. has introduced a full product line of LumiBright UV LE Ultraviolet LED (light-emitting diode) light engines. The versatile and powerful solid-state sources are ideal for ultraviolet (UV) applications in life science, medical, and industrial equipment.

LISTED UNDER: Fiber Optics Illuminators | Lamps and Light Sources

Hardware Auto Focus and Cleanroom Kit

November 19, 2013 8:57 am | Product Releases | Comments

Carl Zeiss Microscopy LLC has introduced its Hardware Auto Focus and cleanroom kit for the Axio Imager Vario microscope system. The Hardware Auto Focus is suitable for surface inspections on reflective, low-contrast samples.

LISTED UNDER: Other Microscope Supplies

Virtual Microscope Images a Touch Away

November 12, 2013 9:54 am | Product Releases | Comments

Researchers and educators who use images captured in the Olympus virtual slide format will soon be able to gain access to their entire library of virtual microscope images from anywhere with a tap of the finger, thanks to the OlyVIA Mobile iPad App, a free download from the Apple Store/iTunes.

LISTED UNDER: Other Microscope Supplies

High-throughput TEM Sample Preparation Workflow

October 30, 2013 8:55 am | Product Releases | Comments

FEI has introduced ExSolve, an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep increases the speed of sample preparation, providing semiconductor and data storage manufacturers with quick and easy access to the data they need to verify and monitor process performance.

LISTED UNDER: TEM (Transmission Electron) | TEM-Supplies | TEM (Transmission Electron Microscope)

Low-profile Scanning Stages

October 24, 2013 9:39 am | Product Releases | Comments

Zaber Technologies has introduced a new xy scanning stage equipped with built-in rotary encoders for closed-loop operation. The ASR-E stages are designed for use with most common microscopes including Leica, Nikon, Olympus and Zeiss.


Automated Probe Calibration

October 23, 2013 9:18 am | Asylum Research | Product Releases | Comments

Asylum Research has introduced the GetReal automated probe calibration feature. With one click GetReal calibrates an atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results.

LISTED UNDER: AFM Supplies | Other Microscope Supplies

Contact Resonance Viscoelastic Mapping Mode

October 21, 2013 9:21 am | Asylum Research | Product Releases | Comments

Asylum Research has introduced the Contact Resonance Viscoelastic Mapping Mode, an option available for Asylum’s Cypher and MFP-3D atomic force microscopes. Contact resonance enables high resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus.

LISTED UNDER: AFM Supplies | Other Microscope Supplies | Atomic Force

AFM-based Infrared Spectroscopy Platform

October 16, 2013 8:47 am | Product Releases | Comments

Anasys Instruments has introduced the nanoIR2, a second-generation AFM-based infrared spectroscopy (AFM-IR) platform. A key breakthrough is the ability of the nanoIR2 to operate with top-side illumination, eliminating the need to prepare samples on a ZnSe prism and enabling measurements on a much more diverse set of samples.

LISTED UNDER: AFM Supplies | Atomic Force | FT-IR

UV-Vis-NIR Spectrophotometer for Microscopes

October 11, 2013 11:17 am | Product Releases | Comments

Craic Technologies has introduced the 508 PV UV-visible-NIR spectrophotometer for microscopes. The 508 Perfect Vision is designed as an add-on to an open photoport of a microscope or probe station to non-destructively analyze the spectra microscopic samples.

LISTED UNDER: Electron Microscope Sample Preparation | Spectrophotometers

Automated Probe Calibration

September 13, 2013 11:46 am | Product Releases | Comments

Asylum Research has announced the release of the new GetReal Automated Probe Calibration feature. With one click, GetReal fully calibrates the atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results.


Silicone Oil Objectives

September 12, 2013 11:02 am | Product Releases | Comments

Olympus has introduced a 40x silicone oil microscope objective, which joins 30x and 60x silicone immersion microscope optics designed for live cell and time-lapse imaging. The objectives markedly improve optical performance for live cell confocal, widefield fluorescence, multiphoton, differential interference contrast and other applications.

LISTED UNDER: Other Microscope Supplies | Microscopes, Optics, Image Analysis, Lasers, Cameras

High-precision Scanning Stage

September 3, 2013 9:32 am | Product Releases | Comments

Leica Microsystems has introduced a high-precision scanning stage for stereo microscopes and macroscopes, the Leica LMT260 XY Scanning Stage. To ensure successful experiments, it offers a repeatability of 0.25 µm for samples weighing less than 0.5 kg, and of 1 µm for heavier loads of 1.5 kg. This repeatability is reached at a resolution of 5 nm.

LISTED UNDER: Stages | Microscopes, Optics, Image Analysis, Lasers, Cameras


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