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AFM Supplies

Automated Probe Calibration

October 23, 2013 9:18 am | Asylum Research | Product Releases | Comments

Asylum Research has introduced the GetReal automated probe calibration feature. With one click GetReal calibrates an atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results.

LISTED UNDER: AFM Supplies | Other Microscope Supplies

Contact Resonance Viscoelastic Mapping Mode

October 21, 2013 9:21 am | Asylum Research | Product Releases | Comments

Asylum Research has introduced the Contact Resonance Viscoelastic Mapping Mode, an option available for Asylum’s Cypher and MFP-3D atomic force microscopes. Contact resonance enables high resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus.

LISTED UNDER: AFM Supplies | Other Microscope Supplies | Atomic Force

AFM-based Infrared Spectroscopy Platform

October 16, 2013 8:47 am | Product Releases | Comments

Anasys Instruments has introduced the nanoIR2, a second-generation AFM-based infrared spectroscopy (AFM-IR) platform. A key breakthrough is the ability of the nanoIR2 to operate with top-side illumination, eliminating the need to prepare samples on a ZnSe prism and enabling measurements on a much more diverse set of samples.

LISTED UNDER: AFM Supplies | Atomic Force | FT-IR
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Automated Probe Calibration

September 13, 2013 11:46 am | Product Releases | Comments

Asylum Research has announced the release of the new GetReal Automated Probe Calibration feature. With one click, GetReal fully calibrates the atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results.

LISTED UNDER: AFM Supplies | AFM.SPM Tips

Scanning Microwave Microscopy Mode

June 25, 2013 8:24 am | Agilent Technologies Inc. | Product Releases | Comments

Agilent Technologies Inc. has announced the availability of scanning microwave microscopy (SMM) capabilities for its high-performance atomic force microscope, the 5500 AFM. Agilent’s second-generation SMM nose cone makes this electrical measurement option compatible with the 5500 system.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

AFM Zoom Option for 3D Optical Microscopes

December 10, 2012 8:38 am | Product Releases | Comments

Bruker Corp. has introduced the NanoLens atomic force microscope (AFM) accessory for ContourGT 3D optical microscopes. Designed for fast installation on a five-position, automated turret, the NanoLens delivers high-resolution imaging capabilities without sacrificing measurement speed in optical modes.

LISTED UNDER: AFM Supplies | Atomic Force

AFM Tools for Life Science Research

September 20, 2012 4:43 am | Product Releases | Comments

Bruker Corp. has introduced its Nanomechanics package, which expands Bio-AFM (atomic force microscope) applications in mechanobiology research. The package includes new analysis models in PeakFoce QNM, the PeakForce Capture function, and the enhanced Quantitative Force-Valume Mapping mode.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Photoconductive Atomic Force Microscopy Module

August 17, 2012 4:50 am | Product Releases | Comments

Bruker Corp. has introduced the Photoconductive Atomic Force Microscopy (pcAFM) module for its Dimension Icon platform. The accessory enables sample illumination while performing nanoscale electrical characterization.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras
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Nanoelectrical AFM Mode

August 14, 2012 5:25 am | Product Releases | Comments

Bruker Corp. has introduced the PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes. PeakForce KPFM uses frequency-modulation detection to provide high spatial resolution Kelvin probe data.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Atomic Force Microscope

August 6, 2012 5:33 am | Product Releases | Comments

Bruker Corp. has introduced the Dimension FastScan Bio atomic force microscope, which enables high-resolution microscopy research in biological dynamics. The microscope uses a XYZ scanner designed to operate at high-speed rates while delivering low drift and low noise.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Mulitple Mode AFM Platform

February 14, 2012 7:35 am | Product Releases | Comments

Anasys Instruments offers the afm+, an integrated atomic force microscope (AFM) platform that combines three analytical capabilities in one instrument.

LISTED UNDER: AFM Supplies | Atomic Force | Microscopes, Optics, Image Analysis, Lasers, Cameras

Cell Imaging System

September 28, 2011 3:58 am | Product Releases | Comments

Leica Microsystems and Molecular Devices have launched the next generation of Leica MM AF imaging systems, a product line that combines Leica Microsystems' microscopy technology and Molecular Devices' MetaMorph NX Software.

LISTED UNDER: Computer Software | AFM Supplies | Atomic Force
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