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Accessories

Photodiode

December 17, 2014 8:20 am | Product Releases | Comments

Opto Diode has introduced the SXUV300C photodiode with a large, 22.05 mm x 15.85 mm rectangular active area. The photodiodes detect energy from extreme ultraviolet wavelengths of 1 to 1,000 nm. With 331 mm2 of active area, the SXUV300C offers a sizable surface for reflective scatter measurements of high-powered UV lasers.

LISTED UNDER: MICROSCOPES, IMAGING AND LASERS | Accessories

Compact Measurement System for 300-mm Optics

April 10, 2014 9:45 am | Product Releases | Comments

4D Technology has introduced a suite of products for high-quality, low-cost measurement of 300-m diameter optics. The suite of 300-mm components includes a compact, high-performance 100- to 300-mm Beam Expander which can be used in horizontal or look-down measurement configurations.

LISTED UNDER: Accessories

Scanning Slit Laser Beam Profiler

February 12, 2013 8:46 am | Product Releases | Comments

Ophir Photonics has introduced the NanoScan 2, a NIST-calibrated scanning slit laser beam profiler. The NanoScan 2 measures continuous wave (CW) and pulsed laser beams across the entire spectral range, from UV to far infrared.

LISTED UNDER: Accessories | Other Laser Systems | Microscopes, Optics, Image Analysis, Lasers, Cameras
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