Research & Development

Accessories

Scanning Slit Laser Beam Profiler

February 12, 2013 8:46 am | Product Releases | Comments

Ophir Photonics has introduced the NanoScan 2, a NIST-calibrated scanning slit laser beam profiler. The NanoScan 2 measures continuous wave (CW) and pulsed laser beams across the entire spectral range, from UV to far infrared.

LISTED UNDER: Accessories | Other Laser Systems | Microscopes, Optics, Image Analysis, Lasers, Cameras
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