2010 R&D 100 Winner
JEOL USA, Inc., Peabody, Mass., in conjunction with the National Institute of Advanced Industrial Science and Technology (AIST), Japan, has developed a new microscopy tool—the ClairScope—that couples optical microscopy with an atmospheric scanning electron microscope (ASEM) in a novel open culture system that retains the samples’ native state while under study.
In this system, an optical microscope is positioned above an open culture dish for quasi-simultaneous observation with the ASEM. This enables correlative photon and electron microscopy. The SEM has been inverted so that the electron gun is below an open sample holder silicon nitride (SiN) window built into its base. The SiN window is approximately 100 nm in thickness, allowing electron transmission but sustaining a 1-atm pressure differential.
The sample holder accepts a wide range of materials, including liquids, gels, and solids. The complimentary information from optical microscopy and the high spatial resolution of SEM can be used to observe dynamic phenomena such as crystallization or electrochemical reactions in real time.
Atmospheric scanning electron microscopy for life science
ClairScope Development Team:
Mitsuru Koizumi, JEOL LTD
Hidetoshi Nishiyama, JEOL LTD
Kouji Ogawa, JEOL Technics Ltd
Chikara Sato, National Institute of Advanced Industrial Science and Technology (AIST)
Mitsuo Suga, JEOL LTD