The FEI Phenom is the world's first "Point and Shoot" desktop scanning electron microscope (SEM)
that is changing everyone’s approach to product development and analysis. It does not require specialized facilities or
highly skilled operators. With magnifications to 20,000x (30 nm resolution) it
exceeds the capabilities of optical microscopes and eliminates the expense,
delay and difficulty of conventional SEM.
Research institutes can use its capabilities to discover
next generation materials. Manufacturers can optimize production ramps and
reduce the time for root cause analysis. Educators can take an exciting leap in
teaching methods by bringing a world that students have never seen before into
the classroom.
