Thursday, February 2, 2012
Bruker's M4 Tornado µ-XRF
system offers high-speed analysis with high spatial resolution by using
capillary optics and silicon drift technology.
Optimized for rapid elemental
analysis, the M4's optics concentrates the X-ray excitation into a spot as
small as 25 µm, yielding count rates of up to 500,000 counts per second. Bruker's
X-Flash silicon drift detector processes high count rates with high energy
resolution, resulting in fast, accurate spectral analysis and elemental maps.
Coupled with a high-speed
stage that moves continuously, measurements can be taken on-the-fly, allowing the
quick mapping of large areas. Accurate sample positioning is supported by a
fish-eye chamber camera and an integrated light microscope with 10X and 100X
magnification.
Bruker Nano,
www.bruker-nano.com
