The JEOL JSM-7600F field emission scanning electron microscope (FE SEM) gives researchers a
tool to use in the development of renewable energy products such as solar thin films, catalytic
materials, and fuel cells. Typically, catalytic materials are imaged using transmission electron
microscopy at high magnifications. The STM detector allows viewing of detail at sub-nanometer
resolution range (0.8 nm resolution) in both bright-field and dark-field modes. Users can view
catalyst support surfaces, as well as active metal nanoparticles. For air-sensitive samples, such
as fuel cells, the large chamber and specimen exchange airlock chamber allow sample handling and
transfer without exposure to atmosphere. To study crystal growth and orientation of solar thin
films, researchers can use the low kV high resolution backscatter imaging with electron
backscatter diffraction (EBSD) analysis. The LABe detector collects both high and low angle
backscattered electrons at low kV and high spatial resolution. Application of specimen bias, using
Gentle Beam mode, enables observation of charging specimens without additional coating. In
addition, an ion beam cross sectional polisher prepares cross sections of solar thin film samples
and can polish the top surface with a grazing incidence ion beam for investigation of porosity and
grain packing.
JEOL USA, www.jeolusa.com
