The EVO HD, a new offering from Carl Zeiss for the conventional scanning electron microscopy (C-SEM) market segment, delivers higher resolution at low acceleration voltages compared to present conventional SEM, according to the company. It also introduces high definition to electron microscopy.
The technological basis for this achievement is the EVO HD source, which features a higher source brightness. This brightness results in an improvement in resolution at low-kV relative to conventional tungsten SEMs. The improved source properties also aid analytical applications with a 30% increase in resolution at 30 kV and 1 nA.
The photo shows a scale of butterfly wing (Pieris Brassicae) taken on the EVO HD electron microscope at 5 kV acceleration voltage. The high source brightness and enhanced low-kV sensitivity of the detector allows for more insight into such non-conductive biological nano-structures. Nano-textures associated with biological structures have attracted considerable attention in many fields.
Carl Zeiss SMT, www.smt.zeiss.com/evohd
Published in R & D magazine: Vol. 52, No. 4, August, 2010, p. 25.
