SPECTRO Analytical Instruments introduced the third generation of the SPECTRO MIDEX micro XRF spectrometer. The latest version of the SPECTRO MIDEX incorporates a number of improvements that make it faster, more powerful, and easier to use than its predecessor. The versatile instrument has been designed particularly for the electric and electronics industries, precious metals market, automotive and aerospace industries, as well as forensic laboratories.
The SPECTRO MIDEX micro-XRF analyzer is equipped with an air-cooled low-power X-ray tube with micro focus. The spectrometer utilizes software controlled collimated point excitation. The size of the measuring spot can be optionally selected in steps between 200 micrometers and 4 mm. The current model, which combines the formerly separate MIDEX and MIDEX M versions, utilizes the latest generation silicon drift detector that processes up to 250,000 pulses per second.
The MIDEX has a sample chamber that may be optionally equipped with a motor- driven XYZ table. For mapping analyses, the travel path can be freely programmed along a surface of 240 x 178 millimeters. For example, users are able examine all of the capacitors on an electronics board.
The MIDEX also has application within the automotive and aerospace industries, where it can search out inclusions in glass and metal samples, and in forensics to view powder burns using X-ray fluorescence.
The new MIDEX supports two types of operation. With the standard configuration, the distance between the excitation source and the measuring spot is two millimeters. This mode is well suited to rapid point measurements such as testing precious metal alloys as well as line scans and mappings of flat surfaces with a large measuring spot. This configuration can be supplemented using an optional helium flush that enables the MIDEX to measure the light elements from magnesium to titanium.
As an alternative, the MIDEX can be configured so that the distance between the excitation source and the measuring spot is 20 mm. This distance is suited for the non-destructive analysis of the lower lying components on a sample. Three- dimensional topologies such as especially high boards or pieces of jewelry with structured surfaces can be easily analyzed.
SPECTRO Analytical Instruments, www.spectro.com
