Carl Zeiss, Inc. introduced new functions for the Axio CSM 700 microscope. The new functions of the Axio CSM 700 confocal light microscope enable materials scientists to measure the 3D topography over large sample areas with more convenience and flexibility.
For this microscope, Carl Zeiss offers a motorized scanning stage with a 150 x 150 mm travel range that is suitable for materials research, quality inspection, and routine applications. Scanning stage control is integrated into the Axio CSM 700 software and allows large sample areas to be captured in a mosaic fashion with high resolution. This function has been further optimized with a stitching algorithm so that no transitions are perceived between the single images in the final mosaic image. Therefore, roughness measurement can be determined with a higher statistical reliability even with large sample areas.
It is also now much easier to operate the Axio CSM 700 thanks to the new, encoded and motorized objective nosepiece which now comes standard.
The Axio CSM 700 measures even low roughness on relatively “soft” surfaces without contact. The microscope visualizes surfaces three-dimensionally, with high resolution and in true color, and also allows precise measurement of 3D microstructures as well as roughness determination with high quality. Topographical measurements can be performed at more than 100 image frames per second. Additional benefits include the reliable detection of height information with step heights from 20 nm up to the millimeter range, as well as images with a depth of focus otherwise only possible with scanning electron microscopes.
The easy-to-use software provides numerous analysis options, including the measurement of roughness, evaluation of layer thickness and particle analysis. Additional functions such as a newly programmed filter facilitate and improve the image processing capabilities.
Carl Zeiss Inc., www.zeiss.com/micro
