Wednesday, November 18, 2009
Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.
Solar Metrology’s System SMX-ILH is atmospheric in-line x-ray fluorescence (XRF) metrology tool platform that provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum, and polyimide or rigid substrates such as float glass.
SMX-ILH is designed to perform measurements in an atmospheric environment, either near-line or in-line. Remote SMX-ILH tool platform models are designed to measure in either one static location or across the gradient (points on a linear line perpendicular to movement) of flexible or rigid glass substrates. Typical measurement applications include Mo thickness and all CIGS combinations (including all CIG alloys and/or film combinations and final CIGS formulations).
Integrating System SMX-ILH into your process is simple. The ILH platform includes both fully integrated, stand-alone tools and remote configurations that can be incorporated directly into your tool or line, providing you with the versatility and adaptability needed to match your requirements at each XRF measurement point in your process.
SMX-ILH utilizes X-ray fluorescence, an enabling technology for CIGS manufacture, that delivers yield management and yield improvement by allowing in-line process control.
Solar Metrology's SMX Measurement tool platform provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.
Solar Metrology, http://www.solarmetrology.com