Film Thickness/Birefringence/SPR Characterization
The Model 2010/M prism coupler measures thickness (±1%) and index (±.0002) in x, y, and z directions without matching fluids for rigid or flexible films (max. index 3.35). Index at wavelengths from 405 to 1550 nm and dn/dT up to 150°C can be measured. Other applications include measurement of crystallinity and orientation in bulk polymers and characterization of surface plasmon resonances and SPR shifts. 609-737-1052; E-mail: info@metricon.com; www.metricon.com
Metricon Corp.
12 N. Main St., Box 63
Pennington, NJ, 08534
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