New Portaspec® X Series Bench Top X-RAY Analyzer
The WDXRF Portaspec X Series bench top model performs multi-elemental sequential analysis in the range of Ti through U and is suited for measuring coating weights of chrome, titanium, phosphorus or zirconium pretreatments; analyze liquids, powders, solids and thin films. Comes complete with built-in computer and software.
Cianflone Scientific Instruments Corporation
800-569-9400; Fax: 412-787-5022
www.cianflone.com
Visit us at Pittcon 2008 Booth #2520
Cianflone Scientific Instruments Corp.
228 RIDC Park West Dr.
Pittsburgh, PA, 15275
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