New microscope for near-field scanning or Raman-AFM
The Park Systems XE-NSOM is specially designed and tailored for advanced optical measurements including nearfield scanning optical microscopy (NSOM), Raman spectrometry, and confocal microscopy. XE-NSOM provides a complete AFM system setup with unsurpassed versatility for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports true non-contact AFM and utilizes cantilever-based closed-loop feedback technology. The open optical head design provides convinient experimental access to the sample enabling reflection and apertureless NSOM modes as well as Raman Spectroscopy. XE-NSOM spells ultimate flexibility built on top of the award-winning XE-AFM platform.
