The power of scanning electron microscopy on the benchtop enables numerous applications across industry.

When FEI, Hillsboro, Ore., introduced the Phenom desktop scanning electron microscope (SEM) in 2007, many thought that the majority of users would be optical microscope users who needed higher resolution. While they have indeed accounted for a significant share of users, a surprisingly large number of users are already using SEM and are attracted to the Phenom because it brings the power of SEM to the lab bench.

Instead of waiting days for results from a centralized SEM facility, and then perhaps finding that the operator did not quite understand what was needed, results are available in minutes, and if the desired information is not evident, the operator can just look again. The immediacy of the desktop SEM, allowing the investigator to direct further inquiry on the basis of the current result, is a compelling benefit, providing results that are not only faster, but also better.

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