November 29, 2007

Molecular-level topographic sample information is now available to users of Parks Systems’ new atomic force microscope. The XE-NSOM/Raman-AFM utilizes near-field optical microscopy and Raman spectroscopy to open up new imaging capabilities including near-field fluorescence, near-field Raman, confocal micro-fluorescence, and confocal micro-Raman. Other new features include cantilever-based aperture/apertureless NSOM, large solid angle side-access optical head, AFM/laser alignment, and seamless integration of AFM and NSOM modes. For more information, click here. www.parkafm.com