2011 R&D 100 Winner
A new scanning electron microscope (SEM) designed and manufactured by JEOL USA Inc., Peabody, Mass., and Tokyo-based JEOL Technics Ltd. and JEOL Ltd., has the capabilities expected of a modern electron microscope: it resolves up to 4 nm and can magnify the surface of a sample by as much as 300,000 times. Accelerating voltage range from 500 V to 20 kV. The instrument also includes an embedded energy dispersive X-ray spectrometer for elemental analysis.
But a key differentiator is how the researcher can interact with this SEM, which is appropriately called the InTouchScope. JEOL has adapted popular commercial multi-touch software interface technology, as well as wireless, and uses it to enhance the operation of its SEM technology.
Control of the InTouchScope is possible through a multi-touch screen interface that puts the SEM’s applications at ready access. Typical tasks such as automatic SEM condition setup based on sample type, simultaneous multiple live image and movie capture, quantitative and qualitative elemental analysis, and low- and high-vacuum operation are more readily accessed.
Technology
Scanning electron microscope with touch-screen interface
Developers
JEOL USA Inc.
JEOL Technics Ltd.
JEOL Ltd.
Development Team
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| InTouchScope Development Team |
The JEOL InTouchScope Development Team
Akira Abe, Principal Developer, JEOL Technics Ltd.
Takenori Miyahara, JEOL Technics Ltd.
Yasunori Ohta, JEOL Ltd.
