2010 R&D 100 Winner
Atomic force microscopy measures topography as well as various materials properties. During measurements, the probe is located in close proximity to the sample, which raises the possibility of measuring temperature-dependent mechanical properties of a sample. However, existing AFM-based thermal analysis systems experience thermally-induced bending of the cantilever that results in spurious deflection signal and variable loads during heating.
Ztherm Modulated Thermal Analysis prevents this issue through the use of a patent-pending cantilever compensation and control solution that provides constant-load detection of thermally induced melting, phase transitions, and morphological effects. Developed by Asylum Research Company, Santa Barbara, Calif, and Oak Ridge National Laboratory, Oak Ridge, Tenn., Ztherm integrates a nanoscale heat source to lower the probed volume of material to the zeptoliter level (≤10-22 L) and spatial resolution to 10 nm, an order of magnitude higher performance than competing instrumentation.
Technology
Thermal atomic force microscope
Developers
Asylum Research Company
Oak Ridge National Laboratory
Development Team
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Top (l-r): Sergei Kalinin, Stephen Jesse, Maxim Nikiforov
Bottom (l-r): Anil Gannepalli and Roger Proksch
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The Ztherm Modulated Thermal Analysis Development Team:
Anil Ganepalli, Asylum Research Company
Stephen Jesse, Oak Ridge National Laboratory
Sergei V. Kalinin, Oak Ridge National Laboratory
Maxim Nikiforov, Oak Ridge National Laboratory
Roger Proksch, Asylum Research Company
