2010 R&D 100 Winner
A challenge to understanding the nanoscale properties of materials, especially their effect on living cells, is a lack of appropriate tools that can non-invasively gather information from both the surface and bulk (sub-surface) regions of a sample.
The Mode-Synthesizing Atomic Force Microscope (MSAFM) was designed by Oak Ridge National Laboratory, Oak Ridge, Tenn., to meet this growing need in nanomaterials study by combining existing and new imaging modalities in a single platform. Modeled on the microcantilever probe of an atomic force microscope (AFM), MSAFM allows the probe and sample to engage in nonlinear mechanical interaction, which generates information gather by a patented MEMS-based mode synthesizing sensor. This sensor opens the AFM to a wide frequency range, allowing combination of modes to be employed, including bimodal and intermodulation AFM, or scanning near-field ultrasound holography.
The system combines atomic-scale resolution with the low cost of an AFM, and offers an alternative in analytical applications as diverse as chip defect study and intracellular probing.
Technology
Mode-synthesizing atomic force microscope
Developers
Oak Ridge National Laboratory
Development Team
Mode-Synthesizing Atomic Force Microscope (MSAFM) Development Team from Oak Ridge National Laboratory
A. Passian
L. Tetard
T. Thundat
