Atomic force microscopy (AFM) probes—components used to image and manipulate materials at the nanoscale—are prone to wear and are considered disposable. A new type of probe, NaDiaProbes, has reached the marketplace after development by Advanced Diamond Technologies, Inc., Romeoville, Ill., Univ. of Pennsylvania, Philadelphia, Pa., and Univ. of Wisconsin-Madison, Madison, Wisc. The key innovation is a type of diamond—an ultrananocrystalline diamond—that takes advantage of the mineral’s properties by achieving extremely small grain sizes for extra hardness. It is made using standard semiconductor techniques, which helps keep the cost low. A low inherent friction and adhesion value also reduces wear. With a tip radius of 15 to 20 nm, the probe, which can be operated in contact and tapping mode, is able to improve lateral resolution as compared to conventional probes made from silicon and silicon nitride. With a top resolution of about 10 nm, the probe exceeds all other probes in performance except for carbon nanotube probes, which are known to be brittle.