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R&D Daily

How Corporate America Competes Globally

July 16, 2004 12:35 pm | Articles | Comments

Integration, collaborations, alliances, and acquisitions dominate the landscape of corporate R&D organizations now and even more so in the future to maintain a competitive stance in the inevitable complete globalization of industry.

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Making Open Innovation Work for You

July 16, 2004 12:35 pm | Articles | Comments

An organized regimen of procedures for finding external innovation providers is essential to establishing a relationship while protecting your vested interests.

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How to Choose a Vacuum System

July 16, 2004 10:22 am | Articles | Comments

Every vacuum process requirement has at least one solution. Mechanical vacuum systems that are used in the 0.

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Photonic Crystal Devices Find Commercial Footing

July 16, 2004 10:22 am | Articles | Comments

Nearly a decade since its original conception, photonic crystals make the leap from the lab to real-world applications. A hollow-core PCF fiber. PCF fiber is fabricated by first fusing stacked silica rods and tubes into a fiber preform with the desired cross-section.

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How to Choose an IR Blackbody Calibration Source

July 16, 2004 10:22 am | Articles | Comments

Understanding your infrared (IR) calibration source does not have to be a topic too hot to handle. It is important to select the proper source for your intended purpose, and to be sure you are using your source properly to ensure the most accurate readings. Hot Plate vs.

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How to Digitize Your Lab

July 16, 2004 10:22 am | Articles | Comments

click the image to enlarge Digital technology has earned itself a permanent position in today’s laboratory via PC’s and various measurement, testing, and analysis apparatus. Information created in an R&D lab can now readily take on many forms such as spectra, datasheets, text files, and images.

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How to Select a Full-Service Foundry for Making MEMS

July 16, 2004 10:22 am | Articles | Comments

Fig. 1: Simulation of liquid flow for microfluidics application. Simulations like this are utilized for studying the flow rate, turbulence, friction, device wear, and other events that a MEMS device would experience, thus helping to predict/determine device performance and reliability.

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How to Measure Birefringence with Ellipsometry

July 16, 2004 10:22 am | Articles | Comments

Spectroscopic Ellipsometry (SE): A common metrology technique for characterizing thin film thickness and refractive index (n and k). It operates on the basis of measuring a polarization change (both amplitude and phase) when light is reflected from a coating.

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How to Choose the Right Current Source

July 16, 2004 10:22 am | Articles | Comments

While all power supplies can deliver current to a device, most merely set the output voltage, then supply as much current as the device demands.

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New, Renewed, and Revived Confocal

July 16, 2004 10:21 am | Articles | Comments

Higher performance and more affordable confocal microscopes now provide biologists with views into living cells that they've never had before.

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Electron Microscopes Stand Corrected

July 16, 2004 10:21 am | Articles | Comments

Correction for the spherical aberration of lenses in electron microscopes is allowing scientists to push the resolution into the sub-angstrom range, opening the doors to new frontiers.

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Microarrays Move Into R & D Mainstream

July 16, 2004 10:21 am | Articles | Comments

Microarray technology has become the de facto standard for analyzing life science materials, approaching the status of being an enabling technology for the industrialization of many pharmaceutical and biotech research and development processes.

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How to Optimize Your Camera-to-Microscope Connection

July 16, 2004 10:21 am | Articles | Comments

Achieving the proper connection between your camera and microscope is critical to maximizing the effectiveness of your research imagery.

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How to Optimize Cross Sectioning and TEM Sample Prep

July 16, 2004 10:21 am | Articles | Comments

The use of Focused Ion Beam (FIB) systems has increased to a high level in recent years. The imaging, milling, and deposition capabilities of the FIB make it the ideal instrument for e.g., site-specific failure analysis, specimen preparation, and nanomachining.

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How to Pick Optomechanical Positioners

July 16, 2004 10:21 am | Articles | Comments

click the image to enlarge Selecting the optimum set of positioners begins with determining the number and type of adjustments needed to align the system.

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